SDRAM (Rev. 1.0E)
Jun. '99
MITSUBISHI LSIs
M2V28S20TP-6,-7,-8
M2V28S30TP-6,-7,-7L,-8,-8L
M2V28S40TP-7,-7L,-8,-8L
128M Synchronous DRAM
(4-BANK x 8,388,608-WORD x 4-BIT)
(4-BANK x 4,194,304-WORD x 8-BIT)
(4-BANK x 2,097,152-WORD x 16-BIT)
ABSOLUTE MAXIMUM RATINGS
Symbol
Vdd
VddQ
VI
VO
IO
Pd
Topr
Tstg
Parameter
Supply Voltage
Supply Voltage for Output
Input Voltage
Output Voltage
Output Current
Power Dissipation
Operating Temperature
Storage Temperature
Conditions
with respect to Vss
with respect to VssQ
with respect to Vss
with respect to VssQ
Ta = 25ºC
Ratings
-0.5 - 4.6
-0.5 - 4.6
-0.5 - 4.6
-0.5 - 4.6
50
1000
0 - 70
-65 - 150
Unit
V
V
V
V
mA
mW
ºC
ºC
RECOMMENDED OPERATING CONDITIONS
(Ta=0 – 70ºC, unless otherwise noted )
Symbol
Parameter
Vdd
Vss
VddQ
VssQ
VIH*1
VIL*2
Supply Voltage
Supply Voltage
Supply Voltage for Output
Supply Voltage for Output
High-level Input Voltage all inputs
Low-level Input Voltage all inputs
NOTES)
1. VIH(max)=5.5V for pulse width less than 10ns.
2. VIL(min)=-1.0V for pulse width less than 10ns.
Min.
3.0
0
3.0
0
2.0
-0.3
Limits
Typ.
3.3
0
3.3
0
Unit
Max.
3.6
V
0
V
3.6
V
0
V
VddQ +0.3
V
0.8
V
CAPACITANCE
(Ta=0 – 70ºC, Vdd= VddQ= 3.3 ± 0.3V, Vss= VssQ= 0V, unless otherwise noted )
Symbol
CI(A)
CI(C)
CI(K)
CI/O
Parameter
Input Capacitance, address pin
Input Capacitance, contorl pin
Input Capacitance, CLK pin
Input Capacitance, I/O pin
Limits (max.)
Test Condition Limits (min.)
Unit
-6 (PC133) -7/-8(PC100)
2.5
@ 1MHz
1.4V bias
2.5
200mV swing
Vcc=3.3V
2.5
4.0
3.8
5.0
pF
3.8
5.0
pF
3.5
4.0
pF
6.5
6.5
pF
MITSUBISHI ELECTRIC
29