M28R400CT100D16 Ver la hoja de datos (PDF) - STMicroelectronics

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componentes Descripción

Fabricante

M28R400CT100D16

Known Good Die 4 Mbit (256Kb x16, Boot Block) 1.8V Supply Flash Memory

STMicroelectronics 

M28R400CT-KGD, M28R400CB-KGD

PRODUCT TEST FLOW

Figure 5. gives an overview of ST’s Known Good

Die test flow.

STMicroelectronics implements quality assurance

procedures throughout the product test flow. In ad-

dition, an off-line quality monitoring program is im-

plemented to ensures that ST’s quality standards

are met on Known Good Die products.

With ST’s quality procedures, Known Good Die

products can be produced without requiring burn-

in.

Figure 5. Product Test Flow

Wafer Sort 1

BAKE 24 hours at 250˚C

Wafer Sort 2

BAKE 12 hours at 250˚C

Wafer Sort 3 High Temperature

Packaging and Shipment

DC Parameters

Functionality

Programmability

Erasability

Data Retention

DC Parameters

Functionality

Programmability

Erasability

DC Parameters

Functionality

Programmability

Erasability

Speed

Visual Inspection Sampling

Wafer Pack

ai08366

7/11

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