UT8Q512 Ver la hoja de datos (PDF) - Aeroflex UTMC

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UT8Q512

512K x 8 SRAM

Aeroflex UTMC 

WRITE CYCLE

A combination of W less than VIL(max) and E less than

VIL(max) defines a write cycle. The state of G is a “don’t care”

for a write cycle. The outputs are placed in the high-impedance

state when either G is greater than V IH(min), or when W is less

than VIL(max).

Write Cycle 1, the Write Enable - Controlled Access in figure

4a, is defined by a write terminated by W going high, with E

still active. The write pulse width is defined by t WLWH when the

write is initiated by W, and by t ETWH when the write is initiated

by E. Unless the outputs have been previously placed in the high-

impedance state byG, the user must wait t WLQZ before applying

data to the nine bidirectional pins DQ(7:0) to avoid bus

contention.

Write Cycle 2, the Chip Enable - Controlled Access in figure

4b, is defined by a write terminated by the latter of E going

inactive. The write pulse width is defined by tWLEF when the

write is initiated by W, and by tETEF when the write is initiated

by the E going active. For the W initiated write, unless the

outputs have been previously placed in the high-impedance state

by G, the user must wait t WLQZ before applying data to the eight

bidirectional pins DQ(7:0) to avoid bus contention.

TYPICAL RADIATION HARDNESS

Table 2. Typical Radiation Hardness

Design Specifications1

Total Dose 50

krad(Si) nominal

Heavy Ion

Error Rate2

<1E-8

Errors/Bit-Day

Notes:

1. The SRAM will not latchup during radiation exposure under recommended

operating conditions.

2. 90% worst case particle environment, Geosynchronous orbit, 100 m ils of

Aluminum.

3

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