M27C320 Ver la hoja de datos (PDF) - STMicroelectronics
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M27C320 Datasheet PDF : 15 Pages
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M27C320
Table 5. AC Measurement Conditions
Input Rise and Fall Times
Input Pulse Voltages
Input and Output Timing Ref. Voltages
High Speed
≤ 10ns
0 to 3V
1.5V
Standard
≤ 20ns
0.4V to 2.4V
0.8V and 2V
Figure 3. AC Testing Input Output Waveform
High Speed
3V
0V
Standard
2.4V
0.4V
1.5V
2.0V
0.8V
AI01822
Figure 4. AC Testing Load Circuit
1.3V
1N914
DEVICE
UNDER
TEST
3.3kΩ
CL
OUT
CL = 30pF for High Speed
CL = 100pF for Standard
CL includes JIG capacitance
AI01823B
Table 6. Capacitance (1) (TA = 25 °C, f = 1 MHz)
Symbol
Parameter
Test Condition
CIN
Input Capacitance
VIN = 0V
COUT
Output Capacitance
VOUT = 0V
Note: 1. Sampled only, not 100% tested.
Min
Max
Unit
10
pF
12
pF
The M27C320 has two control functions, both of
which must be logically active in order to obtain
data at the outputs. In addition the Word-wide or
Byte-wide organisation must be selected.
Chip Enable (E) is the power control and should be
used for device selection. Output Enable (G) is the
output control and should be used to gate data to
the output pins independent of device selection.
Assuming that the addresses are stable, the ad-
dress access time (tAVQV) is equal to the delay
from E to output (tELQV). Data is available at the
output after a delay of tGLQV from the falling edge
of G, assuming that E has been low and the ad-
dresses have been stable for at least tAVQV-tGLQV.
Standby Mode
The M27C320 has standby mode which reduces
the supply current from 50mA to 100µA. The
M27C320 is placed in the standby mode by apply-
ing a CMOS high signal to the E input. When in the
standby mode, the outputs are in a high imped-
ance state, independent of the G input.
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