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LX8587 Ver la hoja de datos (PDF) - Microsemi Corporation

Número de pieza
componentes Descripción
Fabricante
LX8587
Microsemi
Microsemi Corporation Microsemi
LX8587 Datasheet PDF : 11 Pages
1 2 3 4 5 6 7 8 9 10
LX8587x-xx
®
3A Low Dropout Positive Regulators
TM
PRODUCTION DATA SHEET
ELECTRICAL CHARACTERISTICS (CONTINUED)
Unless otherwise specified, the following specifications apply over the operating ambient temperature for the LX8585x-xxC with
0°C TA 125°C and the LX8585-xxI with -25°C TA 125°C except where otherwise noted. Test conditions: VIN -VOUT = 3V;
IOUT = 3A. Low duty cycle pulse testing techniques are used which maintains junction and case temperatures equal to the ambient
temperature.
Parameter
Symbol
Test Conditions
` LX8587-15 / 8587A-15 (1.5V FIXED)(CONTINUED)
Maximum Output Current
Temperature Stability (Note 3)
Long Term Stability (Note 3)
RMS Output Noise (% of VOUT)
(Note 3)
` LX8587-33/87A-33 (3.3V FIXED)
IOUT(MAX)
ΔVOUT(T)
ΔVOUT (t)
VOUT (RMS)
VIN < 7V
TA=125°C, 1000 hours
TA=25°C, 10Hz < f < 10kHz
Output Voltage
Line Regulation (Note 2)
Load Regulation (Note 2)
Thermal Regulation
Ripple Rejection (Note 3)
Quiescent Current
Dropout Voltage
LX8587-33
LX8587A-33
Maximum Output Current
Temperature Stability (Note 3)
Long Term Stability (Note 3)
RMS Output Noise (% of VOUT)
(Note 3)
VOUT
VIN=5V, IOUT=0mA, TA=25°C
4.75V < VIN < 10V, 0mA < IOUT < 3A, P < PMAX
ΔVOUT(VIN)
ΔVOUT
(IOUT)
ΔVOUT
(Pwr)
4.75V < VIN < 7V
4.75V < VIN < 10V
VIN=5V, 0mA < IOUT < IOUT(MAX)
TA=25°C, 20ms pulse
COUT=100µF (Tantalum), IOUT=3A
IQ
0mA < IOUT < IOUT(MAX), 4.75V < VIN < 10V
ΔVOUT=1%, IOUT < IOUT(MAX)
ΔV
ΔVOUT=1%, IOUT < IOUT(MAX)
IOUT(MAX) VIN < 7V
ΔVOUT (T)
ΔVOUT (t) TA=125°C, 1000 hours
VOUT (RMS) TA=25°C, 10Hz < f < 10kHz
LX8587x-xx
Units
Min Typ Max
3.0
5.0
A
0.25
%
0.3
1
%
0.003
%
3.267 3.3 3.333 V
3.235 3.3 3.365 V
1
6
mV
2
10
mV
5
15
mV
0.01 0.02 % / W
60
75
dB
4
10
mA
1.1
1.3
V
1
1.2
V
3
5.0
A
0.25
%
0.3
1
%
0.003
%
Note 2
Note 3
Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output
voltage due to heating effects are covered under the specification for thermal regulation.
These parameters, although guaranteed, are not tested in production.
Copyright © 2000
Rev. 2.0a, 2005-10-25
Microsemi
Integrated Products
11861 Western Avenue, Garden Grove, CA. 92841, 714-898-8121, Fax: 714-893-2570
Page 4

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