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IXFN75N50 Ver la hoja de datos (PDF) - IXYS CORPORATION

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componentes Descripción
Fabricante
IXFN75N50 Datasheet PDF : 4 Pages
1 2 3 4
HiPerFETTM
Power MOSFETs
Single Die MOSFET
N-Channel Enhancement Mode
Avalanche Rated, High dv/dt, Low trr
IXFN 80N50
IXFN 75N50
D
G
VDSS
500 V
500 V
ID25
80 A
75 A
RDS(on)
50 m
55 m
Symbol
VDSS
VDGR
VGS
VGSM
I
D25
I
DM
IAR
EAR
E
AS
dv/dt
PD
TJ
TJM
Tstg
VISOL
Md
Weight
Symbol
VDSS
VGH(th)
IGSS
I
DSS
RDS(on)
Test Conditions
TJ = 25°C to 150°C
TJ = 25°C to 150°C; RGS = 1 M
Continuous
Transient
TC = 25°C, Chip capability
TC = 25°C, pulse width limited by TJM
TC = 25°C
TC = 25°C
TC = 25°C
IS IDM, di/dt 100 A/µs, VDD VDSS,
TJ 150°C, RG = 2
TC = 25°C
50/60 Hz, RMS t = 1 min
IISOL 1 mA
t=1s
Mounting torque
Terminal connection torque
S
S
Maximum Ratings
500
V
500
V
±20
V
±30
V
75N50
75
A
80N50
80
A
75N50
300
A
80N50
320
A
80
A
64
mJ
6
J
5 V/ns
700
W
-55 ... +150
°C
150
°C
-55 ... +150
°C
2500
V~
3000
V~
1.5/13 Nm/lb.in.
1.5/13 Nm/lb.in.
30
g
Test Conditions
VGS = 0 V, ID = 3 mA
VDS = VGS, ID = 8 mA
VGS = ±20 VDC, VDS = 0
VDS = VDSS
VGS = 0 V
VGS = 10 V, ID = 0.5 ID25
Pulse test, t 300 µs,
duty cycle d 2 %
Characteristic Values
(TJ = 25°C, unless otherwise specified)
min. typ. max.
500
2
TJ = 25°C
TJ = 125°C
80N50
75N50
V
4V
±200 nA
100 µA
2 mA
50 m
55 m
miniBLOC, SOT-227 B (IXFN)
E153432
S
G
S
D
G = Gate
S = Source
D = Drain
Either Source terminal of miniBLOC can be used
as Main or Kelvin Source
Features
Internationalstandardpackages
miniBLOC, with Aluminium nitride
isolation
Low RDS (on) HDMOSTM process
Ruggedpolysilicongatecellstructure
Unclamped Inductive Switching (UIS)
rated
Lowpackageinductance
FastintrinsicRectifier
Applications
DC-DC converters
Batterychargers
Switched-mode and resonant-mode
power supplies
DC choppers
Temperatureandlightingcontrols
Advantages
Easy to mount
Space savings
High power density
© 2002 IXYS All rights reserved
98538C (02/02)

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