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SAA5244

Integrated VIP and teletext decoder (IVT1.1)

Philips Electronics 

Philips Semiconductors

Integrated VIP and teletext decoder

(IVT1.1)

Product specification

SAA5244A

LIMITING VALUES

In accordance with the Absolute Maximum System (IEC 134)

SYMBOL

VDD

VI

VO

IO

IIOK

Tamb

Tstg

Vstat

PARAMETER

supply voltage (all supplies)

input voltage (any input)

output voltage (any output)

output current (each output)

DC input or output diode current

operating ambient temperature range

storage temperature range

electrostatic handling

human body model (note 1)

MIN.

−0.3

−0.3

−0.3

−

−

−20

−55

−2000

MAX.

6.5

VDD+0.5

VDD+0.5

±10

±20

70

125

2000

UNIT

V

V

V

mA

mA

°C

°C

V

Note

1. The human body model ESD simulation is equivalent to discharging a 100 pF capacitor through a 1.5 kΩ resistor;

this produces a single discharge transient. Reference Philips Semiconductors test method UZW-B0/FQ-A302

(compatible with MIL-STD method 3015.7).

Failure Rate

The failure rate at Tamb = 55 °C will be a maximum of 1000 FITS (1 FIT = 1 x 10−9 failures per hour).

March 1992

8

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