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A817 Ver la hoja de datos (PDF) - Fairchild Semiconductor

Número de pieza
componentes Descripción
Fabricante
A817
Fairchild
Fairchild Semiconductor Fairchild
A817 Datasheet PDF : 11 Pages
1 2 3 4 5 6 7 8 9 10
Transfer Characteristics (TA = 25°C Unless otherwise specified.)
Symbol DC Characteristic
Test Conditions
CTR Current Transfer
Ratio
IF = ±1mA, VCE = 5V(1)
IF = ±1mA, VCE = 5V(1)
(IF = 10mA, VCE = 5V(1)
Device
H11AA814
H11AA814A
H11A617A
H11A617B
H11A617C
(IF = 5mA, VCE = 5V(1)
H11A617D
H11A817
H11A817A
H11A817B
H11A817C
IF = 1mA, VCE = 5V(1)
H11A817D
H11A617A
H11A617B
H11A617C
H11A617D
VCE (SAT) Collector-Emitter
Saturation Voltage
IC = 1mA, IF = ±20mA
IC = 2.5mA, IF = 10mA
IC = 1mA, IF = 20mA
814 series
617 series
817 series
AC CHARACTERISTIC
tr
Rise Time
tf
Fall Time
IC = 2mA, VCE = 2 V, RL = 100(2)
ALL
IC = 2mA, VCE = 2 V, RL = 100(2)
ALL
Min Typ* Max Unit
20
300 %
50
150 %
40
80 %
63
125 %
100
200 %
160
320 %
50
600 %
80
160 %
130
260 %
200
400 %
300
600 %
13
%
22
%
34
%
56
%
0.2 V
0.4
0.2
4 18 µs
3 18 µs
Isolation Characteristics
Symbol
Characteristic
VISO
Input-Output Isolation Voltage
(note 3)
RISO
CISO
Isolation Resistance
Isolation Capacitance
*Typical values at TA = 25°C.
Test Conditions
(f = 60Hz, t = 1 min)
(II-O 2µA)
(VI-O = 500 VDC)
(VI-O = 0, f = 1 MHz)
Min.
5000
5x1010
Notes:
1. Current Transfer Ratio (CTR) = IC/IF x 100%.
2. For test circuit setup and waveforms, refer to Figure 13.
3. For this test, Pins 1 and 2 are common, and Pins 3 and 4 are common.
Typ.*
1011
0.6
Max.
Units
Vac(rms)
1.0
pf
3
H11AA814 Series, H11A617 Series, H11A817 Series Rev. 1.0.8
www.fairchildsemi.com

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