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HPMX-5001-TY1 Ver la hoja de datos (PDF) - HP => Agilent Technologies

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HPMX-5001-TY1
HP
HP => Agilent Technologies HP
HPMX-5001-TY1 Datasheet PDF : 15 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
HPMX-5001 Absolute Maximum Ratings[1]
Parameter
Min.
Max.
VCC Supply Voltage
Voltage at Any Pin[4]
Power Dissipation[2,3]
-0.2 V
-0.2 V
8V
VCC + 0.2 V
600 mW
RF Input Power
Junction Temperature
Storage Temperature
-55°C
15 dBm
+150°C
+125°C
Thermal Resistance[2]:
θjc = 100°C/W
Notes:
1. Operation of this device in excess of
any of these parameters may cause
permanent damage.
2. TCASE = 25°C.
3. Derate at 10 mW/°C for TCASE > 90°C.
4. Except CMOS logic inputs – see
Summary Characterization Information
table.
HPMX-5001 Guaranteed Electrical Specifications
Unless otherwise noted, all parameters are guaranteed under the following conditions: VCC = 3.0 V. Test
results are based upon use of networks shown in test board schematic diagram (see Figure 28). Typical
values are for VCC = 3.0 V, TA = 25°C.
Symbol
Parameters and Test Conditions
Units Min. Typ. Max.
GC
Receive Conversion Gain[1]
Pout Transmitter Power Output
dB
12 14
Input[2]
2:1 output VSWR dBm
0
2
ICC Device Supply Current
Transmit Mode mA
Receive Mode mA
64 80
43 54
Synth Mode mA
15 19
Standby Mode (with DIVMC Set High) µA
1
50
VDIV DIV Single-Ended Swing[3]
VPP
0.7
1
Notes:
1. 50 RF source, 100 MHz < IF < 300 MHz, 1.89 GHz RF. There is a 750 resistor on chip between RXIF and RXIFB (pins 3 and 4). A
matching network from 750 to 50 is used for this measurement. Insertion loss of the matching network is included in the net
conversion gain figure. See Figure 28.
2. Signal injected into P3 in Figure 28 is -12.5 dBm.
3. DIV output AC coupled into a 2 k|| 10 pF load. See test board schematic diagram, Figure 28.
7-91

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