FSTU3257 Ver la hoja de datos (PDF) - Fairchild Semiconductor
Número de pieza
componentes Descripción
Fabricante
FSTU3257
Fairchild Semiconductor
FSTU3257 Datasheet PDF : 6 Pages
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AC Electrical Characteristics
Symbol
Parameter
TA 40 qC to 85qC,
CL 50pF, RU RD 500:
VCC 4.5 – 5.5V VCC 4.0V
Units
Conditions
Figure
No.
Min Max Min Max
tPHL,tPLH Prop Delay Bus to Bus (Note 7)
Prop Delay, Select to Bus A
0.25
7.0 30.0
0.25
35.0
ns VI OPEN
Figures
2, 3
tPZH, tPZL Output Enable Time, Select to Bus B
Output Enable Time, OE to Bus A, B
7.0 30.0
7.0 30.0
35.0
35.0
VI 7V for tPZL
ns
VI OPEN for tPZH
Figures
2, 3
tPHZ, tPLZ Output Disable Time, Select to Bus B
1.5
8.4
Output Disable Time, Output Enable Time, OE to Bus A, B 1.5
8.8
9.8
9.8
VI 7V for tPLZ
ns
VI OPEN for tPHZ
Figures
2, 3
Note 7: This parameter is guaranteed by design but is not tested. The bus switch contributes no propagation delay other than the RC delay of the typical On
resistance of the switch and the 50pF load capacitance, when driven by an ideal voltage the source (zero output impedance).
Capacitance (Note 8)
Symbol
Parameter
CIN
Control Pin Input Capacitance
A Port
CI/O
Input/Output Capacitance
B Port
CI/O ON State
Input/Output Capacitance ON State (A or B Port)
Note 8: TA 25qC, f 1 MHz, Capacitance is characterized but not tested.
Typ
Max
Units
Conditions
3
pF VCC 5.0V
7.5
pF
5.5
pF
VCC, OE 5.0V
14
pF VCC 5.0V Switch ON
Undershoot Characteristic (Note 9)
Symbol
Parameter
Min
Typ
Max
Units
Conditions
VOUTU
Output Voltage During Undershoot
2.5
VOH 0.3
V
Figure 1
Note 9: This is intended to characterize the device’s protective capabilities by maintaining output signal integrity during an input transient voltage undershoot
event.
Device Test Conditions
Parameter
VIN
R1 - R2
VTRI
VCC
Value
See Waveform
100K
11.0
5.5
Units
V
:
V
V
FIGURE 1.
Transient
Input Voltage (VIN) Waveform
3
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