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FODM8801B Ver la hoja de datos (PDF) - Fairchild Semiconductor

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FODM8801B Datasheet PDF : 14 Pages
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Test Circuits
Pulse Generator:
IF +
1
tr = 5ns
ZO = 50Ω
PW = 50μs
DC = 1%
IF Monitor
2
RM
+5V
VO
4
RL = 4.7kΩ
VO Monitoring Node
GND
3
Input Pulse
Output Pulse
tR
tON
tOFF
(IF = 1.6mA)
tF
90% 5V
10%
VOL
Figure 15. Test Circuit for Propagation Delay, Rise Time, and Fall Time
IF +
1
SW
2
RM
VCM 90%
10%
+5V
RL = 4.7kΩ
4
VO Monitoring Node
GND
3
VCM
Pulse Gen
1kV
0V
VO (IF = 0mA)
VOH
2V
VO (IF = 1.6mA)
0.8V
VOL
Figure 16. Test Circuit for Instantaneous Common-Mode Rejection Voltage
©2010 Fairchild Semiconductor Corporation
FODM8801X Rev. 1.1.2
9
www.fairchildsemi.com

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