FODM8801B Ver la hoja de datos (PDF) - Fairchild Semiconductor

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FODM8801B

OptoHiT™ Series, High-Temperature Phototransistor Optocoupler in Half-Pitch Mini-Flat 4-Pin Package

Fairchild Semiconductor 

Absolute Maximum Ratings

Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be

operable above the recommended operating conditions and stressing the parts to these levels is not recommended.

In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.

The absolute maximum ratings are stress ratings only. TA = 25°C unless otherwise specified

Symbol

Parameter

Value

Units

TOTAL PACKAGE

TSTG

Storage Temperature

TOPR

Operating Temperature

TJ

Junction Temperature

TSOL

Lead Solder Temperature

(Refer to Reflow Temperature Profile on page 13)

EMITTER

IF(average)

Continuous Forward Current

VR

Reverse Input Voltage

PDLED

Power Dissipation(1)(3)

DETECTOR

IC(average)

Continuous Collector Current

VCEO

Collector-Emitter Voltage

VECO

Emitter-Collector Voltage

PDC

Collector Power Dissipation(2)(3)

-40 to +150

°C

-40 to +125

°C

-40 to +140

°C

260 for 10 s

°C

20

mA

6

V

40

mW

30

mA

75

V

7

V

150

mW

Recommended Operating Conditions

The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended

operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not

recommend exceeding them or designing to absolute maximum ratings.

Symbol

TA

VFL(OFF)

IFH

Parameter

Operating Temperature

Input Low Voltage

Input High Forward Current

Value

-40 to +125

-5.0 to +0.8

1 to 10

Units

°C

V

mA

Isolation Characteristics

Symbol

Parameter

Test Conditions

Min.

VISO

RISO

CISO

Input-Output Isolation Voltage f = 60 Hz, t = 1 min., II-O ≤ 10 µA(4)(5)

Isolation Resistance

VI-O = 500 V(4)

Isolation Capacitance

f = 1 MHz

3,750

1012

Typ.

0.3

Max. Unit

VacRMS

Ω

0.5

pF

Notes:

1. Derate linearly from 73˚C at a rate of 0.24 mW/˚C

2. Derate linearly from 73˚C at a rate of 2.23 mW/˚C.

3. Functional operation under these conditions is not implied. Permanent damage may occur if the device is subjected to conditions

outside these ratings.

4. Device is considered a two-terminal device: pins 1 and 2 are shorted together and pins 3 and 4 are shorted together.

5. 3,750 VACRMS for 1 minute is equivalent to 4,500 VACRMS for 1 second.

©2010 Fairchild Semiconductor Corporation

FODM8801X Rev. 1.1.2

3

www.fairchildsemi.com

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