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FOD814A(2011) Ver la hoja de datos (PDF) - Fairchild Semiconductor

Número de pieza
componentes Descripción
Fabricante
FOD814A
(Rev.:2011)
Fairchild
Fairchild Semiconductor Fairchild
FOD814A Datasheet PDF : 12 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
Absolute Maximum Ratings (TA = 25°C Unless otherwise specified.)
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol Parameter
TOTAL DEVICE
TSTG
TOPR
TSOL
TJ
θJC
PTOT
EMITTER
Storage Temperature
Operating Temperature
Lead Solder Temperature
Junction Temperature
Junction-to-Case Thermal Resistance
Total Power Dissipation
IF
Continuous Forward Current
VR
Reverse Voltage
PD
Power Dissipation
Derate above 100°C
DETECTOR
VCEO
VECO
IC
PC
Collector-Emitter Voltage
Emitter-Collector Voltage
Continuous Collector Current
Collector Power Dissipation
Derate above 90°C
Value
FOD814
FOD817
-55 to +150
-55 to +105
-55 to +110
260 for 10 sec
125 Max.
210
200
±50
50
6
70
1.7
70
6
50
150
2.9
Units
°C
°C
°C
°C
°C/W
mW
mA
mW
mW/°C
V
V
mA
mW
mW/°C
©2006 Fairchild Semiconductor Corporation
FOD814 Series, FOD817 Series Rev. 1.1.5
2
www.fairchildsemi.com

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