FOD3150 Ver la hoja de datos (PDF) - Fairchild Semiconductor

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componentes Descripción

Fabricante

FOD3150

High Noise Immunity, 1.0A Output Current, Gate Drive Optocoupler

Fairchild Semiconductor 

Test Circuit (Continued)

1

8

2

7

0.1µF

+

–

VCC = 15 to 30V

IF

3

6

VO > 5V

4

5

Figure 26. IFLH Test Circuit

1

2

+

– VF = 0 to 0.8V

3

4

8

7

0.1µF

+

–

VCC = 15 to 30V

6

VO

5

Figure 27. VFHL Test Circuit

1

2

IF = 10mA

3

4

8

7

0.1µF

+

–

15V or 30V

VCC Ramp

6

VO = 5V

5

Figure 28. UVLO Test Circuit

©2008 Fairchild Semiconductor Corporation

FOD3150 Rev. 1.0.4

13

www.fairchildsemi.com

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