FOD3150(2010) Ver la hoja de datos (PDF) - Fairchild Semiconductor

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componentes Descripción

Fabricante

FOD3150
(Rev.:2010)

High Noise Immunity, 1.0A Output Current, Gate Drive Optocoupler

Fairchild Semiconductor 

Test Circuit (Continued)

1

2

+

–

F = 10kHz

Probe

3

DC = 50%

50Ω

4

8

0.1µF

7

VO

+

–

VCC = 15 to 30V

6

Rg = 20Ω

Cg = 10nF

5

IF

tr

VOUT

tf

90%

50%

10%

tPLH

tPHL

Figure 29. tPHL, tPLH, tR and tF Test Circuit and Waveforms

IF

A

B

5V

+

–

VCM

1

8

2

7

3

6

4

5

+–

VCM = 2,000V

0.1µF

VO

+

–

VCC = 30V

0V

∆t

VO

Switch at A: IF = 10mA

VO

Switch at B: IF = 0mA

VOH

VOL

Figure 30. CMR Test Circuit and Waveforms

©2008 Fairchild Semiconductor Corporation

FOD3150 Rev. 1.0.3

14

www.fairchildsemi.com

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