FOD3150(2010) Ver la hoja de datos (PDF) - Fairchild Semiconductor
Número de pieza
componentes Descripción
Fabricante
FOD3150
(Rev.:2010)
(Rev.:2010)
Fairchild Semiconductor
FOD3150 Datasheet PDF : 19 Pages
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Test Circuit
Pulse Generator
PW = 4.99ms
Period = 5ms
ROUT = 50Ω
Pulse-In
LED-IFmon
Test Conditions:
Frequency = 200Hz
Duty Cycle = 99.8%
VCC = 15V to 30V
VEE = 0V
VF(OFF) = -3.0V to 0.8V
1
2
R2
100Ω
3
4
R1
100Ω
C1 + C2
0.1µF
47µF
Power Supply
+
VCC = 15V to 30V
8
7
6
VOL
5
Iol
D1
C3 +
0.1µF
+
C4
47µF
Power Supply
V = 4V
To Scope
Figure 20. IOL Test Circuit
Pulse Generator
PW = 10µs
Period = 5ms
ROUT = 50Ω
Pulse-In
LED-IFmon
Test Conditions:
Frequency = 200Hz
Duty Cycle = 0.2%
VCC = 15V to 30V
VEE = 0V
IF = 7mA to 16mA
1
2
R2
100Ω
3
4
R1
100Ω
C1 + C2
0.1µF
47µF
Power Supply
+
VCC = 15V to 30V
8
7
6
VOH
5
Ioh
D1
Current
Probe
C3 +
0.1µF
+
C4
47µF
–
Power Supply
V = 4V
To Scope
Figure 21. IOH Test Circuit
©2008 Fairchild Semiconductor Corporation
FOD3150 Rev. 1.0.3
10
www.fairchildsemi.com
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