FOD260L Ver la hoja de datos (PDF) - Fairchild Semiconductor
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FOD260L Datasheet PDF : 14 Pages
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Transfer Characteristics (TA = -40°C to +85°C Unless otherwise specified.)
DC Characteristics
Test Conditions Symbol Min Typ**
High Level Output Current
Low Level Output Voltage
Input Threshold Current
(IF = 250 µA, VCC = 3.3 V, VO = 3.3 V)
IOH
(Note 2) VE = 2.0 V Single Channel
(VCC = 3.3 V, IF = 5 mA, IOL = 13 mA)
VOL
(Note 2) VE = 2.0 V Single Channel
(VCC = 3.3 V, VO = 0.6 V, IOL = 13 mA)
IFT
(Note 2) VE = 2.0 V Single Channel
Max
50
0.6
5
Unit
µA
V
mA
Isolation Characteristics (TA = -40°C to +85°C Unless otherwise specified.)
Characteristics
Test Conditions Device Symbol Min Typ** Max Unit
Input-Output
(Relative humidity = 45%)
II-O
Insulation Leakage Current
(TA = 25°C, t = 5 s)
(VI-O = 3000 VDC)
(Note 12)
1.0*
µA
Withstand Insulation Test
Voltage
Resistance (Input to Output)
Capacitance (Input to Output)
IIO ≤ 2 µA, RH < 50%,
TA = 25°C)
(Note 12) ( t = 1 min.)
FOD060L
FOD063L
FOD260L
(VI-O = 500 V) (Note 12)
(f = 1 MHz) (Note 12)
VISO
RI-O
CI-O
3750
5000
1012
0.6
VRMS
Ω
pF
** All typical values are at VCC = 3.3 V, TA = 25°C
Notes
1. The VCC supply to each optoisolator must be bypassed by a 0.1µF capacitor or larger. This can be either a ceramic or solid
tantalum capacitor with good high frequency characteristic and should be connected as close as possible to the package VCC and
GND pins of each device.
2. Enable Input – No pull up resistor required as the device has an internal pull up resistor.
3. tPLH – Propagation delay is measured from the 3.75 mA level on the HIGH to LOW transition of the input current pulse to the
1.5V level on the LOW to HIGH transition of the output voltage pulse.
4. tPHL – Propagation delay is measured from the 3.75 mA level on the LOW to HIGH transition of the input current pulse to the 1.5V
level on the HIGH to LOW transition of the output voltage pulse.
5. tPSK is the worst case difference between tPHL and tPLH for any devices at the stated test conditions.
6. tr – Rise time is measured from the 90% to the 10% levels on the LOW to HIGH transition of the output pulse.
7. tf – Fall time is measured from the 10% to the 90% levels on the HIGH to LOW transition of the output pulse.
8. tELH – Enable input propagation delay is measured from the 1.5V level on the HIGH to LOW transition of the input voltage pulse
to the 1.5V level on the LOW to HIGH transition of the output voltage pulse.
9. tEHL – Enable input propagation delay is measured from the 1.5V level on the LOW to HIGH transition of the input voltage pulse
to the 1.5V level on the HIGH to LOW transition of the output voltage pulse.
10. CMH – The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the high state (i.e.,
VOUT > 2.0 V). Measured in volts per microsecond (V/µs).
11. CML – The maximum tolerable rate of fall of the common mode voltage to ensure the output will remain in the low output state
(i.e., VOUT < 0.8 V). Measured in volts per microsecond (V/µs).
12. Device considered a two-terminal device: Pins 1,2,3 and 4 shorted together, and Pins 5,6,7 and 8 shorted together.
©2008 Fairchild Semiconductor Corporation
FOD060L, FOD260L, FOD063L Rev. 1.0.3
4
www.fairchildsemi.com
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