DS1044-10 Ver la hoja de datos (PDF) - Dallas Semiconductor -> Maxim Integrated

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DS1044-10

4–in–1 High–Speed Silicon Delay Line

Dallas Semiconductor -> Maxim Integrated 

DS1044

TEST SETUP DESCRIPTION

Figure 2 illustrates the hardware configuration used for

measuring the timing parameters of the DS1044. The

input waveform is produced by a precision pulse gener-

ator under software control. Time delays are measured

by a time interval counter (20 ps resolution) connected

to the output. The DS1044 output taps are selected and

connected to the interval counter by a VHF switch con-

trol unit. All measurements are fully automated with

each instrument controlled by the computer over an

IEEE 488 bus.

DS1044 TEST CIRCUIT Figure 2

PULSE

GENERATOR

4 INPUTS

START

50Ω

TIME INTERVAL

COUNTER

STOP

UNIT UNDER

TEST

VHF

SWITCH

CONTROL

UNIT

OUT

50Ω

OUTPUTS 1–4

021798 3/6

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