DS1013-35 Ver la hoja de datos (PDF) - Dallas Semiconductor -> Maxim Integrated

Número de pieza

componentes Descripción

Fabricante

DS1013-35

5-Tap Silicon Delay Line

Dallas Semiconductor -> Maxim Integrated 

DS1013

TEST SETUP DESCRIPTION

Figure 3 illustrates the hardware configuration used for measuring the timing parameters on the DS1013.

The input waveform is produced by a precision pulse generator under software control. Time delays are

measured by a time interval counter (20 ps resolution) connected between each input and corresponding

output. Each output is selected and connected to the counter by a VHF switch control unit. All

measurements are fully automated, with each instrument controlled by a central computer over an IEEE

488 bus.

TEST CONDITIONS

INPUT:

Ambient Temperature:

Supply Voltage (VCC):

Input Pulse:

Source Impedance:

Rise and Fall Time:

Pulse Width:

Period:

25°C ± 3°C

5.0V ± 0.1V

High = 3.0V ± 0.1V

Low = 0.0V ± 0.1V

50 ohms Max.

3.0 ns Max.

500 ns

1 µs

OUTPUT:

Each output is loaded with the equivalent of one 74F04 input gate. Delay is measured at the 1.5V level on

the rising and falling edge.

NOTE:

Above conditions are for test only and do not restrict the operation of the device under other data sheet

conditions.

6 of 6

Share Link: