CY14B104LA Ver la hoja de datos (PDF) - Cypress Semiconductor
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CY14B104LA Datasheet PDF : 23 Pages
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CY14B104LA, CY14B104NA
Data Retention and Endurance
DATAR
NVC
Parameter
Description
Data Retention
Nonvolatile STORE Operation
Min
Unit
20
Years
200
K
Capacitance
In the following table, the capacitance parameters are listed.[11]
CIN
COUT
Parameter
Description
Input Capacitance
Output Capacitance
Test Conditions
TA = 25°C, f = 1 MHz,
VCC = VCC (Typ)
Max
Unit
7
pF
7
pF
Thermal Resistance
In the following table, the thermal resistance parameters are listed. [11]
Parameter
Description
ΘJA Thermal Resistance
(Junction to Ambient)
ΘJC Thermal Resistance
(Junction to Case)
Test Conditions
Test conditions follow standard test methods
and procedures for measuring thermal
impedance, in accordance with EIA/JESD51.
48-FBGA
28.82
7.84
44-TSOP II 54-TSOP II Unit
31.11
30.73 °C/W
5.56
6.08 °C/W
Figure 5. AC Test Loads
3.0V
OUTPUT
30 pF
577Ω
R1
R2
789Ω
3.0V
OUTPUT
5 pF
577Ω
R1
for tri-state specs
R2
789Ω
AC Test Conditions
Input Pulse Levels ....................................................0V to 3V
Input Rise and Fall Times (10% - 90%) ........................ <3 ns
Input and Output Timing Reference Levels .................... 1.5V
Note
11. These parameters are guaranteedby design but not tested.
Document #: 001-49918 Rev. *B
Page 9 of 23
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