CXA3086 Ver la hoja de datos (PDF) - Sony Semiconductor

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componentes Descripción

Fabricante

CXA3086

6-bit 140MSPS Flash A/D Converter

Sony Semiconductor 

CXA3086Q

Electrical Characteristics Measurement Circuit

Current Consumption Measurement Circuit

Sampling Delay Measurement Circuit

Aperture Jitter Measurement Circuit

4V

VRT

1.95V

VIN

5V

5V

A Icc

AVCC

DVCC1

DVCC2

A IEE

DGND3

CLK/E

100MHz

OSC1

φ: Variable

fr

5MHz PECL

Amp

VIN

CLK

6

CXA3086Q

Logic

Analizer

2V

VRB

DGND2

DGND1

AGND

DVEE3

OSC2

100MHz

ECL

Buffer

1024

samples

Integral Linearity Error Measurement Circuit

Differential Linearity Error Measurement Circuit

Aperture Jitter Measurement Method

+V

VRT

VIN

S2

VRB

S1: ON when A < B

S1

S2: ON when A > B

CLK

VIN

DVM

CXA3086Q

–V

A<B A>B

Comparator

6

A6 B6 6

to to

A1 B1

A0 B0

“0”

“1”

Controller

Buffer

00···0

to

11···0

Error Rate Measurement Circuit

∆υ

∆t

VIN

33

32

31

σ (LSB)

30

29

CLK

Sampling timing fluctuation

(= aperture jitter)

Where σ (LSB) is the deviation of the output codes when

the largest slew rate point is sampled at the clock which

has exactly the same frequency as the analog input

signal, the aperture jitter Taj is:

Taj = σ/

∆υ

∆t

= σ/ (

64

2

× 2πf )

Signal

Source

VIN

CXA3086Q

6

Latch

FC – 1kHz

4

CLK

CLK

+

2Vp-p Sin Wave

Signal

Source

FC

4LSB

1/8

–9–

Latch

A

Comparator

B

A>B

Pulse

Counter

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