CF5037 Ver la hoja de datos (PDF) - Nippon Precision Circuits
Número de pieza
componentes Descripción
Fabricante
CF5037 Datasheet PDF : 10 Pages
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MEASUREMENT CIRCUITS
Measurement Circuit 1
CF5037 series
A IEE1, IEE2
Signal
Generator
R1
VCC
VCC2
OUT
R1
C1
XOUT
R1
OUTN
OE GND,TEST
IIL1, IIL2
A
VIH,VIL
VOD,∆VOD
VOH,VOL
VOS,∆VOS
500mVp-p, sine wave
C1: 0.01µF
R1: 49.9Ω
Note. Connect 0.01µF and approximately 10µF bypass capacitors between supply (VCC, VCC2) and
GND. Note that the 0.01µF capacitor should have circuit wiring as short as possible.
Measurement Circuit 2
A
IPD1
VCC
XIN
RPD1=VCC/IPD1
OE
VCC2 IZ
OUT A
IZ
OUTN A
GND
Measurement Circuit 3
VCC
XIN
XOUT
OE
VCC2
OUT
R1
R1
OUTN
GND
Test point
Duty,VOpp,tr,tf
Test point
R1: 49.9Ω
Note 1. Connect 0.01µF and approximately 10µF bypass capacitors between supply (VCC, VCC2) and
GND. Note that the 0.01µF capacitor should have circuit wiring as short as possible.
Note 2. The recommended differential probe used for measurement should have 5GHz analog
bandwidth, ≥ 50kΩ impedance, and < 1pF capacitive load.
Note 3. If common-mode noise becomes a problem, a DC decoupling capacitor (approximately 1000pF)
and terminating resistor matching the common-mode signal should be connected to the output
center tap.
SEIKO NPC CORPORATION —9
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