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CAT93C86VA Ver la hoja de datos (PDF) - ON Semiconductor

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Fabricante
CAT93C86VA
ON-Semiconductor
ON Semiconductor ON-Semiconductor
CAT93C86VA Datasheet PDF : 13 Pages
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CAT93C86 (Rev. C)
PIN CAPACITANCE (1)
Symbol
COUT
CIN
Test
Output Capacitance (DO)
Input Capacitance (CS, SK, DI, ORG)
POWER-UP TIMING (1)(2)
Symbol
tPUR
tPUW
Parameter
Power-up to Read Operation
Power-up to Write Operation
Conditions
VOUT = 0V
VIN = 0V
Min Typ
Max
5
5
Units
pF
pF
Max
Units
1
ms
1
ms
A.C. TEST CONDITIONS
Input Rise and Fall Times
Input Pulse Voltages
Timing Reference Voltages
Input Pulse Voltages
Timing Reference Voltages
50ns
0.4V to 2.4V
0.8V, 2.0V
0.2VCC to 0.7VCC
0.5VCC
4.5V VCC 5.5V
4.5V VCC 5.5V
1.8V VCC 4.5V
1.8V VCC 4.5V
A.C. CHARACTERISTICS
Symbol Parameter
Test
Conditions
tCSS
tCSH
tDIS
tDIH
tPD1
tPD0
tHZ(1)
tEW
tCSMIN
tSKHI
tSKLOW
tSV
SKMAX
CS Setup Time
CS Hold Time
DI Setup Time
DI Hold Time
Output Delay to 1
Output Delay to 0
Output Delay to High-Z
Program/Erase Pulse Width
Minimum CS Low Time
Minimum SK High Time
Minimum SK Low Time
Output Delay to Status Valid
Maximum Clock Frequency
CL = 100pF(3)
VCC =
1.8V-5.5V
Min Max
200
0
200
200
1
1
400
5
1
1
1
1
DC 500
VCC =
2.5V-5.5V
Min Max
100
0
100
100
0.5
0.5
200
5
0.5
0.5
0.5
0.5
DC 1000
VCC =
4.5V-5.5V
Min Max
50
0
50
50
0.15
0.15
100
5
0.15
0.15
0.15
0.1
DC 3000
Units
ns
ns
ns
ns
µs
µs
ns
ms
µs
µs
µs
µs
kHz
Notes:
(1) These parameters are tested initially and after a design or process change that affects the parameter.
(2) tPUR and tPUW are the delays required from the time VCC is stable until the specified operation can be initiated.
(3) The input levels and timing reference points are shown in the “AC Test Conditions” table.
© 2008 SCILLC. All rights reserved
3
Characteristics subject to change without notice
Doc. No. MD-1091 Rev. R

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