CA3100 Ver la hoja de datos (PDF) - Harris Semiconductor
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CA3100 Datasheet PDF : 7 Pages
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CA3100
Electrical Specifications TA = 25oC, VSUPPLY = ±15V, Unless Otherwise Specified (Continued)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
Wideband Noise Voltage (RTI)
Settling Time (To Within ±50mV of 9V
Output Swing)
eN (Total)
tS
BW = 1MHz, RS = 1kΩ
RL = 2kΩ, CL = 20pF
-
8
-
0.6
NOTES:
3. Low frequency dynamic characteristic.
4. Full Power Bandwidth = S--π---l-Ve---w-O----P-R----–-a---tP--e- .
MAX UNITS
-
µVRMS
-
µs
Test Circuits
V+
AOL = VO θOL
7
VI
0.1µF
3+
VI
51Ω
CA3100
6
VO
2-
20pF
2kΩ
HP606A
OR
EQUIV
V-
4
5
1
WITH VI = 0 ADJ
POTENTIO-
8
0.1µF
METER (RX)
TO GIVE
SET VI TO GIVE
CC
DESIRED VO LEVEL
RX
10kΩ
VO = 0 ± 0.1VDC
AT TEST FREQUENCY NULL ADJUST AT FREQUENCY > 1MHz VI
POTENTIOMETER AND VO MEASURED WITH
HF8405A VECTOR
VOLTMETER
FIGURE 1. OPEN-LOOP VOLTAGE GAIN TEST CIRCUIT AND
OFFSET ADJUST CIRCUIT
10pF V+
VI
+10V
PULSE
tR ≤ 10ns
tWIDTH ≥ 1µs
1
3
SLOPE = SR
0.1µF
7
3+
VO
51Ω CA3100
6
2-
5
2kΩ
500pF
0.1µF
4
VI
+1V
PULSE
tR ≤ 10ns
tWIDTH
≥ 1µs
V+
7
0.1µF
3+
CA3100
6
2-
51Ω
4
0.1
20
2kΩ µF
pF
220Ω
SLOPE = SR
VO
2kΩ
V-
FIGURE 2. SLEW RATE IN 10X AMPLIFIER TEST CIRCUIT
+15V
AV = 100
INPUT REFERRED
NOISE VOLTAGE
eNI
=
eNO
100
3
7
0.1µF
+
CA3100
6
2
-
POST AMPL. AND
2 POLE 1MHz
FILTER
RS
4
HP400EL
VTVM
420Ω
0.1µF
eNO
47Ω
V-
FIGURE 3. FOLLOWER SLEW RATE TEST CIRCUIT
-15V
FIGURE 4. WIDEBAND INPUT NOISE VOLTAGE TEST CIRCUIT
3-3
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