ATA01502D1C Ver la hoja de datos (PDF) - ANADIGICS
Número de pieza
componentes Descripción
Fabricante
ATA01502D1C Datasheet PDF : 8 Pages
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Input Referenced Noise Test Circuit
14
13
12 0.5pF
25 dB
100
TIA
MHz
LPF
VDD = 4.5 V
11
VDD = 5.5V
10
η(dBm) = 10 LOG 6500i n
09
R
- 40
0
40
80
Temperature (OC)
FIgure 11: Input Referred Noise vs Temperature
ATA01502
180
200
220
IIN
0.5pF
240
RF
1502
VOUT
50
100
150
Frequency (MHz)
Figure 12: Phase (IIN to VOUT)
AGC Capacitor
It is important to select an external AGC capacitor of
high quality and appropriate size. The ATA01502D1C
has an on-chip 70 K W resistor with a shunt 4.5-pF
capacitor to ground. Without external capacitance,
the chip will provide an AGC time constant of 315 nS.
For the best performance in a typical 155 MB/s
SONET receiver, a minimum AGC capacitor of 56pF
is recommended. This will provide the minimum
amount of protection against pattern sensitivity and
pulse width distortion on repetitive data sequences
during high average optical power conditions.
Conservative design practices should be followed
when selecting an AGC capacitor, since unit to unit
variability of the internal time constant and various
data conditions can lead to data errors if the chosen
value is too small.
Phase Response
At frequencies below the 3dB bandwidth of the
device, the transimpedance phase response is
characteristic of a single pole transfer function (as
shown in the Phase Vs Frequency curve). The output
impedance is essentially resistive up to 1000 MHz.
PRELIMINARY DATA SHEET - Rev 2
7
08/2001
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