AT28C64/X Ver la hoja de datos (PDF) - Atmel Corporation
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AT28C64/X Datasheet PDF : 11 Pages
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AT28C64/X
AC Read Characteristics
Symbol Parameter
tACC
tCE (1)
tOE (2)
Address to Output Delay
CE to Output Delay
OE to Output Delay
tDF (3, 4)
CE or OE High to Output
Float
Output Hold from OE, CE
tOH
or Address, whichever
occurred first
AC Read Waveforms (1, 2, 3, 4)
AT28C64-12
Min
Max
120
120
10
60
0
45
0
AT28C64-15
Min
Max
150
150
10
70
0
50
0
AT28C64-20
Min
Max
200
200
10
80
0
55
0
AT28C64-25
Min
Max
250
250
10 100
0
60
0
Units
ns
ns
ns
ns
ns
Notes: 1. CE may be delayed up to tACC - tCE after the address
transition without impact on tACC.
2. OE may be delayed up to tCE - tOE after the falling
edge of CE without impact on tCE or by tACC - tOE
after an address change without impact on tACC.
Input Test Waveforms and
Measurement Level
3. tDF is specified from OE or CE whichever occurs first
(CL = 5 pF).
4. This parameter is characterized and is not 100% tested.
Output Test Load
tR, tF < 20 ns
Pin Capacitance (f = 1 MHz, T = 25°C) (1)
Typ
Max
CIN
4
6
COUT
8
12
Note: 1. This parameter is characterized and is not 100% tested.
Units
pF
pF
Conditions
VIN = 0V
VOUT = 0V
2-197
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