27C020 Ver la hoja de datos (PDF) - Advanced Micro Devices

Número de pieza

componentes Descripción

Fabricante

27C020

2 Megabit (256 K x 8-Bit) CMOS EPROM

Advanced Micro Devices 

AC CHARACTERISTICS

Parameter Symbols

Am27C020

JEDEC Standard

Description

Test Setup

-75

-55 -70 -90 -120 -150 -200 -255 Unit

tAVQV

tACC Address to Output Delay

CE#,

OE# = VIL

Max

55

70

90 120 150 200 250

ns

tELQV

tCE Chip Enable to Output Delay OE# = VIL Max 55 70 90 120 150 200 250 ns

tGLQV

tOE Output Enable to Output Delay CE# = VIL Max 40 40 40 50 65 75 100 ns

tEHQZ

tGHQZ

tDF

(Note 2)

Chip Enable High or Output

Enable High to Output High Z,

Whichever Occurs First

Max 25 25 25 30 30 40 60 ns

tAXQX

Output Hold Time from

tOH Addresses, CE# or OE#,

Whichever Occurs First

Min 0 0 0 0 0 0 0 ns

Caution: Do not remove the device from (or insert it into) a socket or board that has VPP or VCC applied.

Notes:

1. VCC must be applied simultaneously or before VPP, and removed simultaneously or after VPP.

2. This parameter is sampled and not 100% tested.

3. Switching characteristics are over operating range, unless otherwise specified.

4. See Figure 3 and Table 1 for test specifications.

SWITCHING WAVEFORMS

2.4

Addresses

0.45

2.0

0.8

Addresses Valid

2.0

0.8

CE#

tCE

OE#

Output

High Z

tOE

tACC

(Note 1)

tOH

Valid Output

tDF (Note 2)

High Z

11507H-9

Notes:

1. OE# may be delayed up to tACC – tOE after the falling edge of the addresses without impact on tACC.

2. tDF is specified from OE# or CE#, whichever occurs first.

PACKAGE CAPACITANCE

Parameter Symbol

Parameter

Description

Test Conditions

CIN

Input Capacitance VIN = 0

COUT

Output Capacitance VOUT = 0

Notes:

1. This parameter is only sampled and not 100% tested.

2. TA = +25°C, f = 1 MHz.

CDV032

PD 032

PL 032

Typ Max Typ Max Typ Max Unit

10 12 10 12

8

10

pF

12 15 12 15

9

12

pF

10

Am27C020

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