EVAL-ADN2812EBZ Ver la hoja de datos (PDF) - Analog Devices

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EVAL-ADN2812EBZ

Continuous Rate 12.3 Mb/s to 2.7 Gb/s Clock and Data Recovery IC with Integrated Limiting Amp

Analog Devices 

ADN2812

ABSOLUTE MAXIMUM RATINGS

TA = TMIN to TMAX, VCC = VMIN to VMAX, VEE = 0 V, CF = 0.47 µF,

SLICEP = SLICEN = VEE, unless otherwise noted.

Table 4.

Parameter

Supply Voltage (VCC)

Minimum Input Voltage (All Inputs)

Maximum Input Voltage (All Inputs)

Maximum Junction Temperature

Storage Temperature

Lead Temperature (Soldering 10 s)

Rating

4.2 V

VEE − 0.4 V

VCC + 0.4 V

125°C

−65°C to +150°C

300°C

Data Sheet

Stresses above those listed under Absolute Maximum Ratings

may cause permanent damage to the device. This is a stress

rating only; functional operation of the device at these or any

other conditions above those indicated in the operational

section of this specification is not implied. Exposure to absolute

maximum rating conditions for extended periods may affect

device reliability.

THERMAL CHARACTERISTICS

Thermal Resistance

32-LFCSP, 4-layer board with exposed paddle soldered to VEE

θJA = 28°C/W.

ESD CAUTION

Rev. E | Page 6 of 28

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