ADIS16266 Ver la hoja de datos (PDF) - Analog Devices
Número de pieza
componentes Descripción
Fabricante
ADIS16266 Datasheet PDF : 24 Pages
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ADIS16266
Data Sheet
Parameter
LOGIC INPUTS
Input High Voltage, VINH
Input Low Voltage, VINL
Logic 1 Input Current, IINH
Logic 0 Input Current, IINL
All Except RST
RST
Input Capacitance, CIN
DIGITAL OUTPUTS
Output High Voltage, VOH
Output Low Voltage, VOL
SLEEP TIMER
Timeout Period3
START-UP TIME
Initial Start-Up Time
Sleep Mode Recovery
Reset Recovery
Flash Memory Update Time
Flash Memory Test Time
Self-Test Time
FLASH MEMORY
Endurance4
Data Retention5
CONVERSION RATE
Sample Rate
Sample Rate Tolerance
POWER SUPPLY
Operating Voltage Range, VCC
Power Supply Current
Test Conditions/Comments
Internal 3.3 V interface
VIH = 3.3 V
VIL = 0 V
The RST pin has an internal pull-up.
Internal 3.3 V interface
ISOURCE = 1.6 mA
ISINK = 1.6 mA
TJ = 55°C
Sleep mode
Min
Typ
Max
Unit
2.0
V
0.8
V
±0.2
±10
µA
−40
−60
µA
−1
mA
10
pF
2.4
V
0.4
V
0.5
128
sec
170
ms
2.5
ms
78
ms
40
ms
18
ms
30
ms
20,000
10
Cycles
Years
2429
SPS
±3
%
4.75
5.0
41
400
5.25
V
mA
µA
1 Characterization data represents ±4σ to fall within the ±1% limit.
2 The maximum guaranteed measurement range is ±14,000°/sec. The sensor outputs measure beyond this range, but performance is guaranteed.
3 Guaranteed by design.
4 Endurance is qualified as per JEDEC Standard 22, Method A117, and measured at −40°C, +25°C, +85°C, and +125°C.
5 Retention lifetime equivalent at a junction temperature (TJ) of 55°C, as per JEDEC Standard 22, Method A117. Retention lifetime decreases with junction temperature.
Rev. A | Page 4 of 24
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