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AD8497CRMZ Ver la hoja de datos (PDF) - Analog Devices

Número de pieza
componentes Descripción
Fabricante
AD8497CRMZ Datasheet PDF : 16 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
AD8494/AD8495/AD8496/AD8497
A Grade
C Grade
Parameter
Test Conditions/Comments Min
Typ Max
Min
Typ Max
Unit
TEMPERATURE RANGE (TA)
Specified Performance
AD8494/AD8495
0
50
0
50
°C
AD8496/AD8497
25
100
25
100
°C
Operational
−40
+125
−40
+125
°C
1 Ambient temperature rejection specifies the change in the output measurement (in °C) for a given change in temperature of the cold junction. For the AD8494 and
AD8495, ambient temperature rejection is defined as the slope of the line connecting errors calculated at 0°C and 50°C ambient temperature. For the AD8496 and
AD8497, ambient temperature rejection is defined as the slope of the line connecting errors calculated at 25°C and 100°C ambient temperature.
2 Error does not include thermocouple gain error or thermocouple nonlinearity.
3 With a 100 kΩ load, measurement junction temperatures beyond approximately 880°C for the AD8494 and AD8496 and beyond approximately 960°C for the AD8495
and AD8497 require supply voltages larger than 5 V or a negative voltage applied to the reference pin. Measurement junction temperatures below 5°C require either a
positive offset voltage applied to the reference pin or a negative supply.
4 Input stage uses PNP transistors, so bias current always flows out of the part.
5 Large output currents can increase the internal temperature rise of the part and contribute to cold junction compensation (CJC) error.
6 Unbalanced supplies can also be used. Care should be taken that the common-mode voltage of the thermocouple stays within the input voltage range of the part.
Rev. 0 | Page 4 of 16

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