EVAL-CED1Z(Rev0) Ver la hoja de datos (PDF) - Analog Devices

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EVAL-CED1Z
(Rev.:Rev0)

1 MSPS, 12-Bit, Simultaneous Sampling SAR ADC with PGA and Four Comparators

Analog Devices 

ABSOLUTE MAXIMUM RATINGS

Table 3.

Parameter

VDRIVE to DGND

VDRIVE to AGND

AVCC to AGND/DGND

CA_CBVCC to CA_CB_GND

CC_CDVCC to CC_CD_GND

AGND to DGND

CA_CB_GND/CC_CD_GND to DGND

Analog Input Voltage to AGND

Digital Input Voltage to DGND

Digital Output Voltage to GND

VREFA/VREFB Input to AGND

COUTA/COUTB/COUTC/COUTD to GND

CA±/CB±/CC±/CD± to

CA_CB_GND/CC_CD_GND

Operating Temperature Range

Storage Temperature Range

Junction Temperature

LFCSP Package

θJA Thermal Impedance

θJC Thermal Impedance

LQFP Package

θJA Thermal Impedance

θJC Thermal Impedance

Pb-Free Temperature, Soldering

Reflow

ESD

Rating

−0.3 V to AVCC

−0.3 V to AVCC

−0.3 V to +7 V

−0.3 V to +7 V

−0.3 V to +7 V

−0.3 V to +0.3 V

−0.3 V to +0.3 V

−0.3 V to AVCC + 0.3 V

−0.3 V to +7 V

−0.3 V to VDRIVE + 0.3 V

−0.3 V to AVCC + 0.3 V

−0.3 V to VDRIVE + 0.3 V

−0.3 V to

CA_CBVCC/CC_CDVCC + 0.3 V

−40°C to +105°C

−65°C to +150°C

150°C

30°C/W

3°C/W

55°C/W

16°C/W

255°C

2 kV

AD7262

Stresses above those listed under Absolute Maximum Ratings

may cause permanent damage to the device. This is a stress

rating only; functional operation of the device at these or any

other conditions above those indicated in the operational

section of this specification is not implied. Exposure to absolute

maximum rating conditions for extended periods may affect

device reliability.

ESD CAUTION

Rev. 0 | Page 7 of 32

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