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AD5535
(Rev.:RevPrE)

32-Channel, 14-Bit DAC with Full-Scale Output Voltage Programmable from 50 V to 200 V

Analog Devices 

Preliminary Technical Data

TERMINOLOGY

Integral Nonlinearity (INL)

A measure of the maximum deviation from a straight line

passing through the endpoints of the DAC transfer function. It

is expressed as a percentage of full-scale range.

Differential Nonlinearity (DNL)

The difference between the measured change and the ideal

1 LSB change between any two adjacent codes. A specified DNL

of ±1 LSB maximum ensures monotonicity.

Zero-Code Voltage

A measure of the output voltage present at the device output

with all 0s loaded to the DAC. It includes the offset of the DAC

and the output amplifier. It is expressed in V.

Offset Error

Calculated by taking two points in the linear region of the

transfer function, drawing a line through these points, and

extrapolating back to the Y axis. It is expressed in mV.

Voltage Gain

Calculated from the change in output voltage for a change in

code multiplied by 16,384 and divided by the REF_IN voltage.

This is calculated between two points in the linear section of the

transfer function.

Gain Error

A measure of the output error with all 1s loaded to the DAC,

and is the difference between the ideal and actual analog output

range. Ideally, the output should be 50 × REF_IN. It is expressed

as a percentage of full-scale range.

DC Power-Supply Rejection Ratio (PSRR)

A measure of the change in analog output for a change in VPP

supply voltage. It is expressed in dB. VPP is varied ±5%.

DC Crosstalk

The dc change in the output level of one DAC at midscale in

response to a full-scale code change (all 0s to all 1s and vice

versa) and the output change of all other DACs. It is expressed

in LSB.

AD5535

Output Temperature Coefficient

A measure of the change in analog output with changes in

temperature. It is expressed in ppm/°C.

Output Voltage Settling Time

The time taken from when the last data bit is clocked into the

DAC until the output has settled to within ±0.5 LSB of its final

value.

Digital-to-Analog Glitch Impulse

The area of the glitch injected into the analog output when the

code in the DAC register changes state. It is specified as the area

of the glitch in nV–s, when the digital code is changed by 1 LSB

at the major carry transition (011 . . . 11 to 100 . . . 00 or 100 . . .

00 to 011 . . . 11).

Digital Crosstalk

The glitch impulse transferred to the output of one DAC at

midscale while a full-scale code change (all 1s to all 0s and

vice versa) is being written to another DAC. It is expressed

in nV–s.

Analog Crosstalk

The area of the glitch transferred to the output (VOUT) of one

DAC due to a full-scale change in the output (VOUT) of another

DAC. The area of the glitch is expressed in nV–s.

Digital Feedthrough

A measure of the impulse injected into the analog outputs from

the digital control inputs when the part is not being written to

(SYNC is high). It is specified in nV–s and is measured with a

worst-case change on the digital input pins, for example, from

all 0s to all 1s and vice versa.

Output Noise Spectral Density

A measure of internally generated random noise. Random noise

is characterized as a spectral density (voltage per √Hz). It is

measured by loading all DACs to midscale and measuring noise

at the output. It is measured in nV/(Hz)1/2.

Rev. PrE | Page 9 of 16

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