A3196LU Ver la hoja de datos (PDF) - Allegro MicroSystems
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A3196LU Datasheet PDF : 12 Pages
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3197
PROTECTED, HIGH-TEMP.,
OPEN-COLLECTOR
HALL-EFFECT LATCH
Output Overloads. Current through the output transis-
tor is sensed with a low-value on-chip aluminum resistor.
The voltage drop across this resistor is fed back to control
the base drive of the output stage. This feedback prevents
the output transistor from exceeding its maximum current
density rating by limiting the output current to between
35 mA and 70 mA. Under short-circuit conditions, the
device will dissipate an increased amount of power (PD =
VOUT x ILIMIT) and the output transistor will be thermally
stressed.
Thermal Stress. When thermal stresses (either internal
or external) cause the junction temperature to exceed
+165°C, thermal shutdown of the output transistor is
activated. The thermal shutdown circuitry only provides
protection against thermal stresses caused by increased
power dissipation of the output transistor.
Overvoltage. The device protects itself against high-
voltage transients by shutting OFF all supply-referenced
active components, reducing the supply current, and
minimizing device power dissipation. Overvoltage
shutdown can occur anywhere between 28 V and 55 V and
device operation above 28 V cannot be recommended.
Under a sustained overvoltage, the device may be required
to dissipate an increased amount of power (PD = VCC x
ICC) and the device may be thermally stressed (see above).
Output Voltage. The output is clamped with an on-chip
Zener diode to limit the maximum output voltage that can
occur during overvoltage faults or when switching an
inductive load.
When any fault condition is removed, the device returns to
normal operating mode.
CRITERIA FOR DEVICE QUALIFICATION
All Allegro sensors are subjected to stringent qualification requirements prior to being released to production. To
become qualified, except for the destructive ESD tests, no failures are permitted.
Qualification Test
Biased Humidity
High-Temperature
Operating Life
Surge Operating Life
Pressure Cooker,
Unbiased
Storage Life
Temperature Cycle
ESD
Human Body Model
ESD
Machine Model
Test Method and
Test Conditions
JESD22-A101
TA = 85°C, RH = 85%
JESD22-A108
TA = 150°C, TJ = 165°C
JESD22-A108
TA = 175°C, TJ = 190°C
JESD22-A102, Method C
MIL-STD-883, Method 1008
TA = 170°C
MIL-STD-883, Method 1010
MIL-STD-883, Method 3015
No. of
Lots
3
Test Length
1200 hrs
Samples
Per Lot
116
3
1200 hrs
116
1
504 hrs
116
3
96 hrs
77
1
1200 hrs
77
3
1000 cycles
153
1
Pre/Post
3 per
Reading
test
1
Pre/Post
3 per
Reading
test
Comments
Device biased for
minimum power
Test to failure
HBM > 16 kV
Test to failure
MM > 800 V
115 Northeast Cutoff, Box 15036
Worcester, Massachusetts 01615-0036 (508) 853-5000
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