74LVX03M Ver la hoja de datos (PDF) - STMicroelectronics

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Fabricante

74LVX03M

LOW VOLTAGE CMOS QUAD 2-INPUT NAND GATE (OPEN DRAIN) WITH 5V TOLERANT INPUTS

STMicroelectronics 

74LVX03

AC ELECTRICAL CHARACTERISTICS (Input tr = tf = 3ns)

Test Condition

Value

Symbol

Parameter

VCC CL

(V) (pF)

TA = 25°C

-40 to 85°C -55 to 125°C Unit

Min. Typ. Max. Min. Max. Min. Max.

tPZL Propagation Delay 2.7 15

Time

2.7 50

3.3(*) 15

5.4 7.7

6.0 8.7

4.8 7.0

9.0

9.5

10.0

11.0

8.1

8.5 ns

3.3(*) 50

5.3 7.6

8.8

9.5

tPLZ Propagation Delay 2.7 50

Time

3.3(*) 50

10.5 14.7 1.0 15.0 1.0 17.0

9.6 13.5 1.0 14.0 1.0 15.0 ns

tOSLH Output To Output

2.7 50

tOSHL

Skew Time (note1,

2)

3.3(*)

50

0.5 1.0

1.5

1.5

0.5 1.0

1.5

1.5 ns

1) Skew is defined as the absolute value of the difference between the actual propagation delay for any two outputs of the same device switch-

ing in the same direction, either HIGH or LOW

2) Parameter guaranteed by design

(*) Voltage range is 3.3V ± 0.3V

CAPACITIVE CHARACTERISTICS

Test Condition

Value

Symbol

Parameter

VCC

(V)

TA = 25°C

-40 to 85°C -55 to 125°C Unit

Min. Typ. Max. Min. Max. Min. Max.

CIN Input Capacitance 3.3

5.4 10

10

10 pF

COUT

Output

Capacitance

3.3

7.3

pF

CPD Power Dissipation

Capacitance

3.3

2.6

pF

(note 1)

1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without

load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/6 (per gate)

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