74LVC1G125GW Ver la hoja de datos (PDF) - NXP Semiconductors.

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Fabricante

74LVC1G125GW

Bus buffer/line driver; 3-state

NXP Semiconductors. 

NXP Semiconductors

74LVC1G125

Bus buffer/line driver; 3-state

VI

G

VCC

VO

DUT

RT

VEXT

RL

CL

RL

mna616

Test data is given in Table 10.

Definitions for test circuit:

RL = Load resistance.

CL = Load capacitance including jig and probe capacitance.

RT = Termination resistance should be equal to the output impedance Zo of the pulse generator.

VEXT = External voltage for measuring switching times.

Fig 10. Test circuit for measuring switching times

Table 10. Test data

Supply voltage

VCC

1.65 V to 1.95 V

2.3 V to 2.7 V

2.7 V

3.0 V to 3.6 V

4.5 V to 5.5 V

Input

VI

VCC

VCC

2.7 V

2.7 V

VCC

tr, tf

 2.0 ns

 2.0 ns

 2.5 ns

 2.5 ns

 2.5 ns

Load

CL

30 pF

30 pF

50 pF

50 pF

50 pF

RL

1 k

500 

500 

500 

500 

VEXT

tPLH, tPHL

open

open

open

open

open

tPZH, tPHZ

GND

GND

GND

GND

GND

tPZL, tPLZ

2VCC

2VCC

6V

6V

2VCC

74LVC1G125

Product data sheet

All information provided in this document is subject to legal disclaimers.

Rev. 11 — 2 July 2012

© NXP B.V. 2012. All rights reserved.

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