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Número de pieza

componentes Descripción

Fabricante

74LV04DB

Quad 2-input NAND gate

Philips Electronics 

Philips Semiconductors

Hex inverter

Product specification

74LV04

DC ELECTRICAL CHARACTERISTICS (Continued)

Over recommended operating conditions. Voltages are referenced to GND (ground = 0V).

LIMITS

SYMBOL PARAMETER

TEST CONDITIONS

-40°C to +85°C

MIN

TYP.

NO TAG

MAX

II

Input leakage

current

VCC = 5.5V; VI = VCC or GND

1.0

ICC

Quiescent supply

current; SSI

VCC = 5.5V; VI = VCC or GND; IO = 0

20.0

Additional

∆ICC quiescent supply VCC = 2.7V to 3.6V; VI = VCC – 0.6V

500

current

NOTE:

1. All typical values are measured at Tamb = 25°C.

-40°C to +125°C

MIN

MAX

1.0

40

850

UNIT

µA

µA

µA

AC CHARACTERISTICS

GND = 0V; tr = tf ≤ 2.5ns; CL = 50pF; RL = 1KΩ

SYMBOL

PARAMETER

WAVEFORM

CONDITION

VCC(V)

1.2

tPHL/tPLH

Propagation delay

nA to nY

Figure 1

2.0

2.7

3.0 to 3.6

4.5 to 5.5

NOTES:

1. Unless otherwise stated, all typical values are measured at Tamb = 25°C

2. Typical values are measured at VCC = 3.3 V.

LIMITS

–40 to +85°C

MIN

TYP

NO TAG

MAX

40

14

20

10

15

8NO TAG 12

9

–40 to +125°C

MIN MAX

25

19

15

11

UNIT

ns

AC WAVEFORMS

VM = 1.5 V at VCC ≥ 2.7 V and ≤ 3.6 V;

VM = 0.5 × VCC at VCC < 2.7 V and ≥ 4.5 V;

VOL and VOH are the typical output voltage drop that occur with the

output load.

VI

nA INPUT

GND

VOH(2)

nY OUTPUT

VOL(2)

VM(1)

t PHL

VM(1)

t PLH

SV00395

Figure 1. Input (nA) to output (nY) propagation delays

and output transition times.

TEST CIRCUIT

Vcc

PULSE

GENERATOR

Vl

RT

D.U.T.

VO

50pF

CL

RL= 1k

Test Circuit for Outputs

DEFINITIONS

RL = Load resistor

CL = Load capacitance includes jig and probe capacitiance

RT = Termination resistance should be equal to ZOUT of pulse generators.

TEST

tPLH/tPHL

VCC

< 2.7V

2.7–3.6V

≥ 4.5 V

VI

VCC

2.7V

VCC

SV00902

Figure 2. Load circuitry for switching times

1998 Apr 20

5

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