74F244 Ver la hoja de datos (PDF) - Philips Electronics
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74F244 Datasheet PDF : 12 Pages
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Philips Semiconductors
Octal buffers (3-State)
Product specification
74F244/74F244B
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
CONDITIONS1
LIMITS
UNIT
MIN TYP2 MAX
VOH
High-level output voltage
VCC = MIN,
IOH = -3mA ±10%VCC 2.5
V
VIL = MAX,
±5%VCC 2.7
3.4
V
VIH = MIN
IOH = -15mA ±10%VCC 2.0
V
±5%VCC 2.0
V
VOL
Low-level output voltage
VCC = MIN,
VIL = MAX,
IOL = MAX ±10%VCC
VIH = MIN,
±5%VCC
VIK
Input clamp voltage
VCC = MIN, II = IIK
II
Input current at maximum input voltage
VCC = MAX, VI = 7.0V
IIH
High-level input current
VCC = MAX, VI = 2.7V
74F244 OEa, OEb
0.55 V
0.42 0.55 V
-0.73 -1.2 V
100 µA
20 µA
-1.0 mA
IIL
Low-level input current
74F244 Ian, Ibn
VCC = MAX, VI = 0.5V
74F244B all inputs
-1.6 mA
-40 µA
IOZH
Off-state output current,
high-level voltage applied
VCC = MAX, VO = 2.7V
50 µA
IOZL
Off-state output current,
low-level voltage applied
VCC = MAX, VO = 0.5V
-50 µA
IOS
Short-circuit output current3
VCC = MAX
-100
-225 mA
ICCH
40
60 mA
74F244
ICCL VCC = MAX
60
90 mA
ICC
Supply current (total)
ICCZ
60
90 mA
ICCH
20
30 mA
74F244B ICCL VCC = MAX
50
70 mA
ICCZ
29
40 mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
1994 Dec 5
5
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