6MBI100S-060 Ver la hoja de datos (PDF) - Fuji Electric
Número de pieza
componentes Descripción
Fabricante
6MBI100S-060 Datasheet PDF : 13 Pages
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Reliability Test Items
Test
cate-
gories
Test items
Test methods and conditions
1 High temperature
Reverse Bias
Test temp.
Bias Voltage
Bias Method
2 High temperature
Reverse Bias
Test duration
Test temp.
Bias Voltage
Bias Method
3 Intermitted
Operating Life
(Power cycle)
( for IGBT )
Test duration
ON time
OFF time
Test temp.
Number of cycles
+0
: Ta = 125 -5 ℃
(Tj ≦ 150 ℃)
: VC = 0.8×VCES
: Applied DC voltage to C-E
VGE = 0V
: 1000hr.
+0
: Ta = 125 -5 ℃
(Tj ≦ 150 ℃)
: VC = VGE = +20V or -20V
: Applied DC voltage to G-E
VCE = 0V
: 1000hr.
: 2 sec.
: 18 sec.
: Tj=100±5 deg
Tj ≦ 150 ℃, Ta=25±5 ℃
: 15000 cycles
Reference
norms
EIAJ
ED-4701
Number
of sample
Accept-
ance
number
D - 313
5
(1:0)
D - 323
5
(1:0)
D - 322
5
(1:0)
Failure Criteria
Item
Characteristic
Symbol
Failure criteria
Unit
Note
Lower limit Upper limit
Electrical
Leakage current
characteristic
ICES
-
±IGES
-
USL×2 mA
USL×2 A
Gate threshold voltage VGE(th) LSL×0.8 USL×1.2 mA
Saturation voltage
VCE(sat)
-
USL×1.2 V
Forward voltage
VF
-
Thermal IGBT
VGE
-
resistance
or VCE
USL×1.2 V
USL×1.2 mV
FWD
VF
-
USL×1.2 mV
Isolation voltage
Viso
Broken insulation
-
Visual
Visual inspection
inspection
Peeling
-
The visual sample
-
Plating
and the others
LSL : Lower specified limit.
USL : Upper specified limit.
Note : Each parameter measurement read-outs shall be made after stabilizing the components
at room ambient for 2 hours minimum, 24 hours maximum after removal from the tests.
And in case of the wetting tests, for example, moisture resistance tests, each component
shall be made wipe or dry completely before the measurement.
MS5F5327
7
13
H04-004-03
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