28C16 Ver la hoja de datos (PDF) - STMicroelectronics
Número de pieza
componentes Descripción
Fabricante
28C16 Datasheet PDF : 18 Pages
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M28C16
Table 4. AC Measurement Conditions
Input Rise and Fall Times
≤ 20ns
Input Pulse Voltages
0.4V to 2.4V
Input and Output Timing Ref. Voltages 0.8V to 2.0V
Note that Output Hi-Z is defined as the point where data is no
longer driven.
Figure 7. AC Testing Input Output Waveforms
2.4V
0.4V
2.0V
0.8V
AI00826
Figure 8. AC Testing Equivalent Load Circuit
1.3V
1N914
DEVICE
UNDER
TEST
3.3kΩ
OUT
CL = 30pF
CL includes JIG capacitance
AI01129
Table 5. Capacitance (1) (TA = 25 °C, f = 1 MHz )
Symbol
Parameter
Test Condition
CIN
Input Capacitance
COUT
Output Capacitance
Note: 1. Sampled only, not 100% tested.
VIN = 0V
VOUT = 0V
Min
Max
Unit
6
pF
12
pF
Table 6. Read Mode DC Characteristics (TA = 0 to 70°C or –40 to 85°C; VCC = 4.5V to 5.5V)
Symbol
Parameter
Test Condition
Min
Max
Unit
ILI
Input Leakage Current
ILO
Output Leakage Current
ICC (1)
Supply Current (TTL inputs)
Supply Current (CMOS inputs)
ICC1 (1)
ICC2 (1)
Supply Current (Standby) TTL
Supply Current (Standby) CMOS
VIL
Input Low Voltage
VIH Input High Voltage
VOL Output Low Voltage
VOH Output High Voltage
Note: 1. All I/O’s open circuit.
0V ≤ VIN ≤ VCC
0V ≤ VIN ≤ VCC
E = VIL, G = VIL , f = 5 MHz
E = VIL, G = VIL , f = 5 MHz
E = VIH
E > VCC –0.3V
IOL = 2.1 mA
IOH = –400 µA
– 0.3
2
2.4
10
µA
10
µA
30
mA
25
mA
1
mA
100
µA
0.8
V
VCC +0.5
V
0.4
V
V
Table 7. Power Up Timing (1) (TA = 0 to 70°C or –40 to 85°C; VCC = 4.5V to 5.5V)
Symbol
Parameter
Min
Max
Unit
tPUR
Time Delay to Read Operation
tPUW
Time Delay to Write Operation (once VCC ≥ 4.5V)
VWI
Write Inhibit Threshold
Note: 1. Sampled only, not 100% tested.
1
µs
10
ms
3.0
4.2
V
6/18
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