27C256-30I Ver la hoja de datos (PDF) - Microchip Technology

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27C256-30I

256K (32K x 8) Low-Voltage CMOS EPROM

Microchip Technology 

27LV256

TABLE 1-3: READ OPERATION AC CHARACTERISTICS

AC Testing Waveform: VIH = 2.4V and VIL = 0.45V; VOH = 2.0V VOL = 0.8V

Output Load:

1 TTL Load + 100 pF

Input Rise and Fall Times: 10 ns

Ambient Temperature: Commercial:

Tamb = 0°C to +70°C

Industrial:

Tamb = -40°C to +85°C

Parameter

Sym

27HC256-20

Min Max

27HC256-25

Min Max

27HC256-30

Min Max

Units

Conditions

Address to Output Delay tACC —

200

—

250 — 300

ns CE = OE = VIL

CE to Output Delay

tCE

—

200

—

250 — 300

ns OE = VIL

OE to Output Delay

tOE

—

100

—

125 — 125

ns CE = VIL

CE or OE to O/P High

tOFF

0

50

0

50

0

50

ns

Impedance

Output Hold from

Address CE or OE,

whichever goes first

tOH

0

—

0

—

0

—

ns

FIGURE 1-1: READ WAVEFORMS

V IH

Address

V IL

Address valid

V IH

CE

V IL

V IH

OE

V IL

Outputs

O0 - O7

V OH

V OL

High Z

t CE(2)

t OE(2)

t ACC

t OFF(1,3)

t OH

Valid Output

High Z

Notes: (1) t OFF is specified for OE or CE, whichever occurs first

(2) OE may be delayed up to t CE - t OE after the falling edge of CE without impact on t CE

(3) This parameter is sampled and is not 100% tested.

 2004 Microchip Technology Inc.

DS11020H-page 3

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