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25LC320AT-HSN

8K-256K SPI Serial EEPROM High Temp Family Data Sheet

Microchip Technology 

25LCXXX

1.0 ELECTRICAL CHARACTERISTICS

Absolute Maximum Ratings(†)

VCC............................................................................................................................................................................. 6.5V

All inputs and outputs w.r.t. VSS ..........................................................................................................-0.6V to VCC +1.0V

Storage temperature ................................................................................................................................. -65°C to 155°C

Ambient temperature under bias........................................................................................................... -40°C to 150°C(1)

ESD protection on all pins.......................................................................................................................................... 4 kV

Note 1: AEC-Q100 reliability testing for devices intended to operate at 150°C is 1,000 hours. Any design in which

the total operating time between 125°C and 150°C will be greater than 1,000 hours is not warranted with-

out prior written approval from Microchip Technology Inc.

† NOTICE: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the

device. This is a stress rating only and functional operation of the device at those or any other conditions above those

indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for an

extended period of time may affect device reliability.

TABLE 1-1: DC CHARACTERISTICS

DC CHARACTERISTICS

Extended (H): TA = -40°C to +150°C

VCC = 2.5V to 5.5V

Param.

No.

Sym.

Characteristic

Min.

Max. Units

Test Conditions

D001 VIH1

D002

D003

D004

D005

D006

VIL1

VIL2

VOL1

VOL2

VOH

D007 ILI

D008 ILO

High-level input

voltage

Low-level input

voltage

Low-level output

voltage

High-level output

voltage

Input leakage current

Output leakage

current

.7 VCC

-0.3

-0.3

—

—

VCC -0.5

—

—

VCC+1

0.3VCC

0.2VCC

0.4

0.2

—

±2

±2

V

V VCC ≥ 2.7V

V VCC < 2.7V

V IOL = 2.1 mA

V IOL = 1.0 mA

V IOH = -400 μA

μA CS = VCC, VIN = VSS OR VCC

μA CS = VCC, VOUT = VSS OR VCC

D009 CINT

Internal Capacitance

—

(all inputs and

outputs)

7

pF TA = 25°C, CLK = 1.0 MHz,

VCC = 5.0V (Note)

D010 ICC Read

—

—

Operating Current

5

mA

2.5

mA

D011 ICC Write

D012 ICCS

Standby Current

—

5

mA

—

3

mA

—

10

μA

Note: This parameter is periodically sampled and not 100% tested.

VCC = 5.5V; FCLK = 5.0 MHz;

SO = Open

VCC = 2.5V; FCLK = 3.0 MHz;

SO = Open

VCC = 5.5V

VCC = 2.5V

CS = VCC = 5.5V, Inputs tied to VCC or

VSS, 150°C

© 2009 Microchip Technology Inc.

Preliminary

DS22131C-page 3

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