EN27C01070TI Ver la hoja de datos (PDF) - Eon Silicon Solution Inc.

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Fabricante

EN27C01070TI

1Megabit EPROM (128K x 8)

Eon Silicon Solution Inc. 

EN27C010

FIGURE 7. OUTPUT TEST WAVEFORMS AND MEASUREMENTS

45 and 55 devices:

AC

DRIVING

LEVELS

3.0V

0.0V

1.5V

tR, tF < 5 ns (10% to 90%)

70 and 90 devices:

AC

DRIVING

LEVELS

2.4V

0.45V

tR, tF < 20 ns (10% to 90%)

AC

MEASUREMENT

LEVEL

2.0 AC

MEASUREMENT

0.8 LEVEL

Output Test Load

1.3V

OUTPUT

PIN

(1N914)

3.3K

CL

Note: CL = 100pF including

jig capacitance, except for the

-45 and -55 devices, where

CL = 30pF.

DC PROGRAMMING CHARACTERISTICS

Symbol

ILI

VIL

VIH

VOL

VOH

ICC2

IPP2

VID

Parameter

Input Load Current

Input Low Level

Input High Level

Output Low Voltage

Output High Voltage

VCC Supply Current

VPP Supply Current

A9 Product Identification Voltage

Test

Conditions

VIN = VIL, VIH

IOL = 2.1 mA

IOH = -400 µA

CE = PGM = VIL,

Min.

-0.5

0.7 VCC

2.4

11.5

Limits

Max

5.0

0.8

VCC + 0.5

0.45

40

10

12.5

Units

µA

V

V

V

V

mA

mA

V

4800 Great America Parkway Ste 202

10

Santa Clara, CA. 95054

Tel: 408-235-8680

Fax: 408-235-8685

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