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100329A Ver la hoja de datos (PDF) - Fairchild Semiconductor

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100329A Datasheet PDF : 8 Pages
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Test Circuitry (ECL-to-TTL)
Note: RT = 50termination resistive load. When an input or output is being monitored by a scope, RTis supplied by the scopes 50input resistance. When
an input or output is not being monitored, an external 50resistance must be applied to serve as RT.
Note: The TTL 3-STATE pull-up switch is connected to +7V only for ZL and LZ tests.
Note: TTL and ECL force signals are brought to the DUT via 50coax lines.
Note: VTTL is decoupled to ground with 0.1 µF, VEE is decoupled to ground with 0.01 µF and VCC is connected to ground.
FIGURE 3. ECL-to-TTL AC Test Circuit
Switching Waveforms (ECL-to-TTL)
Note: DIR is LOW, OE is HIGH
FIGURE 4. ECL-to-TTL TransitionPropagation Delay and Transition Times
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