100311QI Ver la hoja de datos (PDF) - Fairchild Semiconductor

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100311QI

Low Skew 1:9 Differential Clock Driver

Fairchild Semiconductor 

Absolute Maximum Ratings(Note 1)

Storage Temperature (TSTG)

−65°C to +150°C

Maximum Junction Temperature (TJ)

+150°C

Pin Potential to Ground Pin (VEE)

−7.0V to +0.5V

Input Voltage (DC)

VEE to +0.5V

Output Current (DC Output HIGH)

−50 mA

ESD (Note 2)

≥2000V

Commercial Version

Recommended Operating

Conditions

Case Temperature (TC)

Commercial

0°C to +85°C

Industrial

−40°C to +85°C

Supply Voltage (VEE)

−5.7V to −4.2V

Note 1: The “Absolute Maximum Ratings” are those values beyond which

the safety of the device cannot be guaranteed. The device should not be

operated at these limits. The parametric values defined in the Electrical

Characteristics tables are not guaranteed at the absolute maximum rating.

The “Recommended Operating Conditions” table will define the conditions

for actual device operation.

Note 2: ESD testing conforms to MIL-STD-883, Method 3015.

DC Electrical Characteristics (Note 3)

VEE = −4.2V to −5.7V, VCC = VCCA = GND, TC = 0°C to +85°C

Symbol

Parameter

Min

Typ

Max

Units

Conditions

VOH

VOL

VOHC

VOLC

VBB

VDIFF

VCM

VIH

Output HIGH Voltage

Output LOW Voltage

Output HIGH Voltage

Output LOW Voltage

Output Reference Voltage

Input Voltage Differential

Common Mode Voltage

Input HIGH Voltage

−1025

−1830

−1035

−1380

150

−955

−1705

−1320

−870

−1620

−1610

−1260

mV VIN = VIH (Max)

Loading with

mV or VIL (Min)

50Ω to −2.0V

mV VIN = VIH

Loading with

mV or VIL (Max)

50Ω to −2.0V

mV IVBB = −300 µA

mV Required for Full Output Swing

VCC − 2.0

−1165

VCC − 0.5

V

−870

mV Guaranteed HIGH Signal for

All Inputs

VIL

Input LOW Voltage

−1830

−1475

mV Guaranteed LOW Signal for

All Inputs

IIL

Input LOW Current

IIH

Input HIGH Current

CLKIN, CLKIN

0.50

µA VIN = VIL (Min)

VIN = VIH (Max)

100

µA

EN

250

ICBO

Input Leakage Current

−10

µA

VIN = VEE

IEE

Power Supply Current

−115

−57

mA Inputs Open

Note 3: The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional

noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are cho-

sen to guarantee operation under “worst case” conditions.

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