HYB511000BJL Ver la hoja de datos (PDF) - Infineon Technologies

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componentes Descripción

Fabricante

HYB511000BJL

1 M×1-Bit Dynamic RAM Low Power 1 M×1-Bit Dynamic RAM

Infineon Technologies 

HYB 511000BJ/BJL-50/-60/-70

1 M × 1-DRAM

Absolute Maximum Ratings

Operating temperature range .........................................................................................0 to + 70 ˚C

Storage temperature range......................................................................................– 55 to + 150 ˚C

Soldering temperature ............................................................................................................260 ˚C

Soldering time .............................................................................................................................10 s

Input/output voltage ........................................................................................................ – 1 to + 7 V

Test Function Input voltage ....................................................................................... – 1 to + 10.5 V

Power supply voltage...................................................................................................... – 1 to + 7 V

Power dissipation..................................................................................................................... 0.6 W

Data out current (short circuit) ................................................................................................ 50 mA

Note: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent

damage of the device. Exposure to absolute maximum rating conditions for extended periods

may affect device reliability.

DC Characteristics

TA = 0 to 70 ˚C; VSS = 0 V; VCC = 5 V ± 10 %

Parameter

Input high voltage

Input low voltage

Test enable input high voltage

Test disable input low voltage

Output high voltage (IOUT = – 5 mA)

Output low voltage (IOUT = 4.2 mA)

Input leakage current, any input except TF

(0 V ≤ VIN ≤ 6.5 V, all other pins = 0 V)

Output leakage current

(DO is disabled, 0 V ≤ VOUT ≤ 5.5 V)

Average VCC supply current:

-50 version

-60 version

-70 version

(RAS, CAS, address cycling: tRC = tRC min.)

Standby VCC supply current (RAS = CAS = VIH)

Symbol

VIH

VIL

VIH(TF)

VIL(TF)

VOH

VOL

II(L)

IO(L)

ICC1

ICC2

Limit Values

min.

max.

2.4

6.5

– 1.0 0.8

VCC + 4.5 10.5

– 1.0

VCC + 1.0

2.4

–

–

0.4

– 10

10

– 10

10

–

90

–

80

–

70

–

2

Unit

V

V

V

V

V

V

µA

µA

mA

mA

mA

mA

Test

Condition

1)

1)

1)

1)

1)

1)

1)

1)

2) 3)

2) 3)

2) 3)

–

Semiconductor Group

37

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