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HIP0045 Ver la hoja de datos (PDF) - Intersil

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HIP0045 Datasheet PDF : 10 Pages
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HIP0045
Serial Peripheral Interface Timing (MOSI, MISO Load Capacitor = 100pF, See Figure 1)
PARAMETER
SYMBOL
TEST CONDITION
MIN TYP MAX UNITS
Data Valid Time, SCK to Data at MISO Valid
Time for SCK Low before CE Low (SCK Setup Time
before CE High to Low Change)
tV
VCC = 5V ±0.1V
tSCK_LEAD
-
-
100
ns
100
-
-
ns
Time for SCK High after CE High
CE Pulse Filter Time
tSCK_LAG
150
-
-
ns
-
Note 9
-
ns
NOTES:
7. The MOSFET Output Drain is internally clamped with a Drain-to-Gate zener diode that turns-on the MOSFET; holding the Drain at the Output
Clamp Voltage, VOC.
8. The measurement of Output Leakage Current includes the Output Pull-Down Current, ISK. Each Output has a Current Pull-Down which is used
to detect open load fault conditions.
9. The digital filter time for the output latch function determines if the output latch function will be enabled. The output latch function will only be
enabled if a positive CE slope occurs after 8 SCK clock cycles or a multiple of 8 SCK cycles since the last CE negative slope change.
Timing Diagrams
CE
SCK
(CPOL = 0, CPHA = 1)
MSB 6
5
4
3
2
1
LSB
INTERNAL STROBE FOR DATA CAPTURE
FIGURE 1A. DATA AND CLOCK TIMING DIAGRAM
CE
(INPUT)
tLEAD tWSCKH
SCK
(INPUT)
MISO
(OUTPUT)
HIGH
Z
LAST BIT
tWSCKL
TRANSMITTED
D7O
tEN
tV
MOSI
(INPUT)
D7I
tSU tH
D6O
D6I
DRIVER
OUTPUT
OLD
tLAG
D0O
D0I
FIGURE 1B. SPI TIMING DIAGRAM
4-5
tDIS
FAULT-INDUCED
TURN-OFF
NEW
tDON
tDOFF
tDF

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