SST27SF010-70-3C-NG Ver la hoja de datos (PDF) - Silicon Storage Technology

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SST27SF010-70-3C-NG

512 Kbit / 1 Mbit / 2 Mbit (x8) Many-Time Programmable Flash

Silicon Storage Technology 

Data Sheet

512 Kbit / 1 Mbit / 2 Mbit Many-Time Programmable Flash

SST27SF512 / SST27SF010 / SST27SF020

VIHT

VILT

INPUT

VHT

VLT

REFERENCE POINTS

VHT

VLT

OUTPUT

1152 F06.0

AC test inputs are driven at VIHT (2.4 V) for a logic “1” and VILT (0.4 V) for a logic “0”. Measurement reference points for

inputs and outputs are VHT (2.0 V) and VLT (0.8 V). Input rise and fall times (10% ↔ 90%) are <10 ns.

Note: VHT - VHIGHTest

VLT - VLOW Test

VIHT - VINPUT HIGH Test

VILT - VINPUT LOW Test

FIGURE 9: AC INPUT/OUTPUT REFERENCE WAVEFORMS

TO DUT

TO TESTER

CL

RL LOW

VDD

RL HIGH

1152 F07.1

FIGURE 10: A TEST LOAD EXAMPLE

©2005 Silicon Storage Technology, Inc.

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