NAA133S-B Ver la hoja de datos (PDF) - Unspecified

Número de pieza

componentes Descripción

Fabricante

NAA133S-B

Numeric Display/Case Size 7.0 x 11.0 mm

Unspecified 

131S/133S Series

Numeric Display/Case Size 7.0 x 11.0 mm

Reliability Testing Result

Reliability Tes ting

Result

Room Temp.

Operating Life

Resistance to

Soldering Heat

Temperature Cycling

Wet High Temp.

Storage Life

High Temp.

Storage Life

Low Temp.

Storage Life

Lead Tension

Vibration,

Variable Frequency

Lead Bend

Shock

Applicable Standard

Testing Conditions

EIAJ ED-

4701/ 100(101)

EIAJ ED-

4701/ 300(302)

EIAJ ED-

4701/ 100(105)

EIAJ ED-

4701/ 100(103)

EIAJ ED-

4701/ 200(201)

EIAJ ED-

4701/ 200(202)

EIAJ ED-

4701/ 400(401)

EIAJ ED-

4701/ 400(403)

EIAJ ED-

4701/ 400(401)

JISC 7201

A-8

Ta = 25℃, IF= Maxium Rated Current/ seg

260±5℃, 3mm from package base

Minimum Rated Storage Temperature(30min)

〜Normal Temperature(15min)

〜Maximum Rated Storage Temperature(30min)

〜Normal Temperature(15min)

Ta = 60±2℃, RH = 90±5%

Ta = Maximum Rated Storage Temperature

Ta = Minimum Rated Storage Temperature

5N,1time

98.1m/ s2 (10G), 100 〜 2KHz sweep for 20min.,

XYZ each direction

2.5N, 0°←→ 90°

It falls on wood engraving from height of 75cm.

Duration

Failure

1,000 h 0/ 10

10s 0/ 10

5 cycles 0/ 10

1,000 h 0/ 10

1,000 h 0/ 10

1,000 h 0/ 10

10s 0/ 10

2 h 0/ 10

Twice 0/ 10

3 times 0/ 10

Failure Criteria

Items

Luminous Intensity

Forward Voltage

Reverse Current

Cosmetic Appearance

Symbols

Iv

VF

IR

-

Conditions

IFValue of each product

Luminous Intensity

IFValue of each product

Forward Voltage

VR = Maximum Rated

Reverse Voltage V

-

Failure criteria

Testing Min. Value ＜ Spec. M in. Value x 0.5

Testing Max. Value ≧ Spec. M ax. Value x 1.2

Testing Max. Value ≧ Spec. M ax. Value x 2.5

Occurrence of notable decoloration,

deformation and cracking

2007.8.31

Page 11

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