BAS40-04 Ver la hoja de datos (PDF) - Diodes Incorporated.

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componentes Descripción

Fabricante

BAS40-04

SURFACE MOUNT SCHOTTKY BARRIER DIODE

Diodes Incorporated. 

Marking Information

BAS40/ -04/ -05/ -06

Shanghai A/T Site

Chengdu A/T Site

xxx = Product Type Marking Code

K43 = BAS40

K44 = BAS40-04

K45 = BAS40-05

K46 = BAS40-06

YM = Date Code Marking for SAT (Shanghai Assembly/ Test site)

Y̅ M = Date Code Marking for CAT (Chengdu Assembly/ Test site)

Y or Y̅ = Year (ex: A = 2013)

M = Month (ex: 9 = September)

Date Code Key

Year 1999

Code

K

2000

L

2001

M

Month

Jan

Feb

Code

1

2

2002

N

Mar

3

2003 2004 2005

P

R

S

Apr

May

4

5

2006 2007 2008

T

U

V

Jun

Jul

6

7

2009 2010 2011

W

X

Y

Aug

Sep

8

9

2012

Z

Oct

O

2013 2014 2015

A

B

C

Nov

Dec

N

D

Maximum Ratings (@TA = +25°C, unless otherwise specified.)

Characteristic

Peak Repetitive Reverse Voltage

Working Peak Reverse Voltage

DC Blocking Voltage

Forward Continuous Current (Note 6)

Forward Surge Current (Note 6)

@ t < 1.0s

Symbol

VRRM

VRWM

VR

IFM

IFSM

Value

40

200

600

Unit

V

mA

mA

Thermal Characteristics

Characteristic

Power Dissipation (Note 6)

Thermal Resistance, Junction to Ambient Air (Note 6)

Operating Temperature Range

Storage Temperature Range

Symbol

PD

RJA

TJ

TSTG

Value

350

357

-55 to +125

-65 to +150

Unit

mW

°C/W

°C

°C

Electrical Characteristics (@TA = +25°C, unless otherwise specified.)

Characteristic

Reverse Breakdown Voltage (Note 7)

Forward Voltage

Reverse Leakage Current (Note 7)

Total Capacitance

Reverse Recovery Time

Symbol Min Typ

V(BR)R

40



VF

 

IR

 20

CT

 4.0

trr

 

Max



380

1000

200

5.0

5.0

Unit

Test Condition

V IR = 10µA

mV

tp < 300µs, IF = 1.0mA 

tp < 300µs, IF = 40mA

nA tp < 300µs, VR = 30V

pF VR = 0V, f =1.0MHz

ns

IF = IR = 10mA to IR = 1.0mA,

RL = 100Ω

Notes:

6. Part mounted on FR-4 board with recommended pad layout, which can be found on our website at http://www.diodes.com/datasheets/ap02001.pdf.

7. Short duration pulse test used to minimize self-heating effect.

BAS40/ -04/ -05/ -06

Document number: DS11006 Rev. 25 - 2

2 of 5

www.diodes.com

December 2013

© Diodes Incorporated

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