WS1M8-35FI(2004) Ver la hoja de datos (PDF) - White Electronic Designs => Micro Semi
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WS1M8-35FI Datasheet PDF : 6 Pages
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White Electronic Designs
WS1M8-XXX
AC CHARACTERISTICS
VCC = 5.0V, VSS = 0V, -55°C ≤ TA ≤ +125°C
Parameter
Read Cycle
Read Cycle Time
Address Access Time
Output Hold from Address Change
Chip Select Access Time
Output Enable to Output Valid
Chip Select to Output in Low Z
Output Enable to Output in Low Z
Chip Disable to Output in High Z
Output Disable to Output in High Z
Symbol
tRC
tAA
tOH
tACS
tOE2
tCLZ1
tOLZ2
tCHZ1
tOHZ2
-17
Min Max
17
17
0
17
9
2
0
9
9
-20
Min Max
20
20
0
20
10
2
0
10
10
-25
Min Max
25
25
0
25
12
2
0
12
12
1. This parameter is guaranteed by design but not tested.
2. OE# is internally tied to the GND and not accessible on the WS1M8-XCXX.
-35
Min Max
35
35
0
35
25
4
0
15
15
-45
Min Max
45
45
0
45
25
4
0
20
20
-55
Min Max
55
55
0
55
25
4
0
20
20
Units
ns
ns
ns
ns
ns
ns
ns
ns
ns
AC CHARACTERISTICS
VCC = 5.0V, VSS = 0V, -55°C ≤ TA ≤ +125°C
Parameter
Write Cycle
Write Cycle Time
Chip Select to End of Write
Address Valid to End of Write
Data Valid to End of Write
Write Pulse Width
Address Setup Time
Address Hold Time
Output Active from End of Write
Write Enable to Output in High Z
Data Hold Time
Symbol
-17
tWC
tCW
tAW
tDW
tWP
tAS
tAH
tOW1
tWHZ1
tDH
17
14
14
9
14
0
0
2
9
0
-20
20
14
14
10
14
0
0
3
9
0
-25
25
15
15
10
15
0
0
4
10
0
1. This parameter is guaranteed by design but not tested.
-35
35
25
25
20
25
0
0
4
15
0
-45
45
35
35
25
35
0
5
5
15
0
-55
Units
55
ns
50
ns
50
ns
25
ns
40
ns
0
ns
5
ns
5
ns
25 ns
0
ns
AC TEST CIRCUIT
I OL
Current Source
D.U.T.
Ceff = 50 pf
VZ ≈ 1.5V
(Bipolar Supply)
I OH
Current Source
AC TEST CONDITIONS
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 3.0 V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
Notes:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75 Ω.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
White Electronic Designs Corp. reserves the right to change products or specifications without notice.
July 2004
Rev. 5
3
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com
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